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Tags
  • 3D Metrology
  • biometric
  • camera
  • Dennis Doane
  • design capability
  • DLP chip
  • DLP Discovery
  • DLP products
  • DLP technology
  • DLP® Products
  • DMD
  • fringe patterns
  • industrial inspection
  • light manipulation
  • Lithography
  • machine vision
  • MEMS
  • metrology
  • MOEMS
  • Pico
  • Pico Projector Development Kit
  • Rapid Prototyping
  • structured light
  • ultra-violet
  • UV
Related Posts
  • Blog Post: 3D Metrology: The Third Dimension and why you need it

    DennisDoane DennisDoane
    Hello and welcome to the new Texas Instruments DLP 3D Metrology forum. I have spent almost 25 years working on a variety of machine vision applications with Texas Instruments and DLP® Products. Now, DLP Products is moving into 3D Metrology applications using structured light fringe patterns generated...
    on Nov 21, 2008
  • Blog Post: If One Is Good, Three MUST Be Better, Right?

    Madadayo Madadayo
    This installment I will actually attempt to do something useful and answer a frequently asked question about the DLP ® Pico™ Projector Development Kit optical engine. The optical engine uses one each red, green, and blue LEDs (three total) arranged much like the figure below. ( Note, this figure...
    on Feb 25, 2009
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