This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

TPS50601-SP: SEFI effect induced on the TPS50601-SP

Part Number: TPS50601-SP

Dear TI support,

in reference to the component TPS50601-SP, we would like to know which are the SEFI effects on this component and when occurs.

Please let me know if there is a radiation report upadted wrt to the October 2016 report and please It could be of great help to us to know the SEFI effects on the TPS50601

Thank you in advance

Best  Regards

Gianluca Caruso

  • Hey Gianluca,

    You can always look up our radiation data at:

    Near the bottom will be devices that have a link to download the radiation report right below the "download datasheet"

    The radiation report for the TPS50601-SP is at the following link: 

    This report should include the SEFI effects.

    Thanks,

    Daniel

  • Hi Gianluca, as Daniel mentioned the current report at ti.com addresses SEFI at a top level. However, we are about to publish a more extensive and detailed report at ti.com that is the result of taking radiation data over the last 6-9 months. This report provides clarity on the SEFI conditions, let me try to summarize it but also let me clarify that even though we call it SEFI, it's a self-recoverable SEFI. Nothing needs to be done to the device to recover.

    1. SEFI 1 - a false trigger on the PG (Power Good) signal. There is not issue at all at the actual output voltage, just a trigger on the PG signal. This is definitely a benign SEFI and it can be externally cleared with a capacitor. The onset for this is about 10MeV and the cross-section is 2E-5 cm^2 based on a 95% confidence interval.

    1. SEFI 2 - this is an actual event on both signals, PG and PHASE (hence VOUT). The onset for this SEFI is 48 MeV and the cross-section is 8.5E-6 cm^2, also based on a 95% confidence interval.

    The testing conditions for all the data we took was using VIN=5V, VOUT=2.5V at a load current of 6A at a switching frequency of 100kHz. We used a soft start cap of 10nF and the reason why I mention this is because the recovery time for SEFI2 is mostly dominated by this cap. The recovery time (many plots will be shown in the new report) is about 5ms.

    I hope this answer your questions but please let me know if we can be of further assistance.

    Thanks,

    JV

  • Dear Daniel

    I have the radiation report and data sheet of component.

    What I realy need is more information on the SEFI in the PGOOD signal.

    Thank you in advance
  • Thank you Javier this the answer to my question.

    We are evaluating it.

    I will contact you in case of further assistance
    Best Regards
    Gianluca
  • Dear Javier

    Please could you send us the plots of events on both signals, PG and PHASE, in case of SEFI 2 ?

    Do you confirm me that both SEFI are self-recoverables ?

    For the SEFI 1 what is the recovery time ?

    Thank you a lot for your support

    BR

    Gianluca

  • Gianluca, I sent you an e-mail about this. And yes, both SEFI are self-recoverables. For SEFI1 (false PG), the recovery time is about 50us.

    Thanks,

    JV