Tool/software: Linux
Hi All,
I needs your help.
The following two Nand Flash are referred in project.
a) MT29F4G08ABAEAWP : 4096 byte per page, 224 byte per page OOB
b). TC58NVG2S0HTA00: 4096 byte per page, 256 byte per page OOB
After NAND parameter porting, the mtd test embed in Linux has been used for testing.
However there are some errors after test.
Here it's the test result of MTD test code.
mtd_nandbiterrs.ko | mtd_oobtest.ko | others | |
MT29F4G08ABAEAWP | OK | OK | OK |
TC58NVG2S0HTA00 | NG, the 1st OOB data has been corrupted during write data area only. | NG, 1 bitflip exist more than 10 units data |
OK |
From the test result, I don't know what's the actual reason. therefore I doubt that weather the GPMC timing is reasonable. But I do not find the details for how to configure the nand timing in the specification.
Can you help to check the timing parameters for TC58NVG2S0HTA00?
Thank you in advanced.
1) MPU Setting Timing
2) Toshiba TC58 Timing