Part Number: TPA6211A1
My customer is using the TPA6211A1.
Some samples has large gain error in comparison to normal one.
Its abnormal gain is larger than simulation result by TINA-TI, so I suspect spec out.
Please refer the attached files.
TPA6211A.xlsx TPA6211A sim.TSC
Appearing probabillity of abnormal sample is about 1%.
This is caused by not boards but samples, we checked by swapping IC.
Could you investigate about this defect?
My colleague will take a look at this and will answer as soon as possible.
Best regards,Luis Fernando Rodríguez S.
We are glad that we were able to resolve this issue, and will now proceed to close this thread.
If you have further questions related to this thread, you may click "Ask a related question" below. The newly created question will be automatically linked to this question.
I'll check if we have faced any similar complaint before with this device.
From your analysis it seems that internal feedback resistor variation is higher than spec.
Best regards,-Ivan SalazarApplications Engineer - Low Power Audio & Actuators
In reply to Ivan Salazar:
Thank you for your help.
When can your inform for me?
In reply to Kuramochi Tadahiko:
How is this progress?
I have confirmed that we haven't received any complaint related to increased gain on this device. That means there is no previous analysis related to it.
We will review if the spec shown in the data sheet is correct; during my research I found that gain is characterized in V/V with an upper limit of 1.11 and not in terms of the feedback resistance.Tolerance of the input resistor must be considered for the gain measurement, perhaps the input resistance in your test is rising the gain for all the tested units.
Thank you for your information.
>Tolerance of the input resistor must be considered for the gain measurement, perhaps the input resistance in your test is rising the gain for all the tested units.
We have checked what it depends on not resistors but IC by swapping the IC.
>We will review if the spec shown in the data sheet is correct; during my research I found that gain is characterized in V/V with an upper limit of 1.11 and not in terms of the feedback resistance.
Does it mean that much gain error is occurred by test defect?
Please let me know if you need the abnormal samples.
Is there possibility that this is caused by manufacturing process?
We could check the abnormal gain samples, perhaps the ATE can detect if gain is too high, but there is a chance that the results are not abnormal since this should be tested during production.
Could you please reach out to me at: firstname.lastname@example.org or provide an email address? I'd like to follow up off-the-forum in order to loop in our CQE to check if ATE can be used to test your units.
We'll handle this through direct email contact.I'm closing this e2e thread for now.
All content and materials on this site are provided "as is". TI and its respective suppliers and providers of content make no representations about the suitability of these materials for any purpose and disclaim all warranties and conditions with regard to these materials, including but not limited to all implied warranties and conditions of merchantability, fitness for a particular purpose, title and non-infringement of any third party intellectual property right. No license, either express or implied, by estoppel or otherwise, is granted by TI. Use of the information on this site may require a license from a third party, or a license from TI.
TI is a global semiconductor design and manufacturing company. Innovate with 100,000+ analog ICs andembedded processors, along with software, tools and the industry’s largest sales/support staff.