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ADC16DV160 - DC Offset Issue on Captured Data

Other Parts Discussed in Thread: ADC16DV160

My customer has a question on the ADC16DV160. I searched the forums and didn’t find a similar issue, most likely because it’s simple. 

We are seeing a DC offset issue on the captured data, and I suspect that it is due to the missing capacitors ( C33, C52, and C53 - shown in the eval board schematic, pg. 6 of http://www.ti.com/lit/ug/snau024/snau024.pdf, Can you confirm that this is indeed the case or if not, what other issues would cause a DC offset in the data.

 

 

 

 

 

 

  • Hi John,

    The capacitors at the input are not likely to cause a DC offset issue. Note that the ADC inherently has some DC offset. Large DC offset issue may be due to one of the following:

    - DC coupling to the ADC input and components further up the signal chain creating a DC offset

    - Incorrect data capture - somehow the output data bits are not being correctly put back into 16-bit samples, creating an offset. Can also be caused by the analysis script assuming a sample resolution different than 16-bits.

    - Trying to drive the ADC analog input single-ended. This is not recommended.

    Regars, Josh

  • Hi John

    How will I come to know whether incorrect data capture is happening?
  • Hi John

    I doubt I am not doing the data caoture correctly. Moreover, my captured data is clean hen i see 4K samples, but very bad when i see 32k samples from 1hz to 78mhz.

    Moreover, I can see a dc offset of 2.3V at the input of the anti aliasing filter before the ADC and an offset of 1.13V at the output of this filter and the input of ADC. Will this offset create problems? If yes, how can I remove them?
  • Hi Sarika
    Can you send txt files containing the 4k and 32k samples you are referring to?
    When creating your reply click on the 'Use rich formatting' link below the right edge of the response window. That will bring up additional options for formatting and allow attaching files.
    If you could attach the schematics for the signal path circuitry up to the ADC and the ADC connections that would also be helpful.
    Best regards,
    Jim B
  • Hi John

    That problem is now coming with both 4k and 32k samples. We are getting a lot of spikes in the captured data. Moreover the noise floor looks high.
  • Hi Sarika

    To confirm the issue is not caused by problems with data capture, please enable the Fixed Pattern data mode.

    Set Register 00h Bits 6:5 to 11. (Fixed pattern mode instead of Normal Operation)

    Then adjust the register settings at Registers 08h to 0Bh to generate patterns that will be useful for capture. I would recommend the following.

    08h = 04h (pattern 000, then 001)

    09h = 4Ch (pattern 010, then 011)

    0Ah =  94h (pattern 100, then 101)

    0Bh =  80h (pattern 100, then 000)

    This will give a repeating sequence of data as follows:

    • 0000 0000 0000 0000
    • 1111 1111 1111 1111
    • 1010 1010 1010 1010
    • 1000 0000 0000 0000
    • 1111 1111 0000 0000
    • 0000 0000 1111 1111
    • 1111 1111 0000 0000
    • 0000 0000 0000 0000

    If the problem is related to data capture, the first thing to try would be shifting the Output Clock Phase adjustment. Register 01h, Bits 4:2 allow the output data clock to be adjusted earlier and later than the default position.

    If pattern mode capture works OK then the issue is not data capture and must be caused by some other problem (configuration, clocking, input signal path etc.)

    Best regards,

    Jim B

     

  • Hi Jim

    I did pattern test with the fixed atterns suggested by you, with with the default phase of 95dg.
    The output in hex as per my understanding should be:
    0000
    FFFF
    AAAA
    8000
    FF00
    00FF
    FF00
    0000

    The output I am getting is :

    0000
    FF00
    FFFF
    0000
    8000
    AAAA
    00FF
    FF00
    0000

    What can be the problem?
  • Hi Sarika

    I think you are almost getting the correct data but for some reason are getting pairs of samples out of order before the final result.

    Here is a comparison between the correct pattern, what you are seeing, and what is possible by swapping every pair of samples:

    Expected Pattern Reported Pattern Reordering data pairs
    0000 0000  
    FFFF FF00  
    AAAA FFFF 0000
    8000 0000 FFFF
    FF00 8000 AAAA
    00FF AAAA 8000
    FF00 00FF FF00
    0000 FF00 00FF
    0000 0000 FF00
    FFFF FF00 0000
    AAAA FFFF  
    8000 0000  
    FF00 8000  
    00FF AAAA  
    FF00 00FF  
    0000 FF00  
    0000 0000  
    FFFF FF00  
    AAAA FFFF  
    8000 0000  
    FF00 8000  
    00FF AAAA  
    FF00 00FF  
    0000 FF00  

    Please check your capture firmware to see if there is any way that pairs of samples could be out of order.

    Best regards,

    Jim B

  • Hi Jim

    I think what I am getting should be the result of the pattern test. Please check once.

    But I am getting this till 2k sample depth. Once I increase the sample depth to 4k or 8k the number of error bits increases with increasing sample depth?

  • Hi Sarika

    There is nothing in the ADC structure or output timing that will result in different results between the first 2k and later samples.

    I recommend reviewing your data capture and storage design to identify the cause of the error bits when the sample depth is increased.

    Best regards,

    Jim B