Part Number: DLP2010EVM-LC
Hi,
we would like to use the DLP2010EVM-LC for outdoor metrology where the light conditions are unconstant. The system moves from location to location whereas the effect of light changes. Is the DLP2010EVM-LC capable to provide a solid pattern for high-accuarcy metrology (height, width, depth)?
We were experimenting with more simple light sources but the changing of effect of light destroyed the pattern and did not allow high-accuracy metrology.
Also is there a recommended camera EVM for high-accuracy metrology / high-accuracy 3D scanning?
Best regards
Bruno