This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

DLP2010EVM-LC: Outdoor metrology

Part Number: DLP2010EVM-LC

Hi,

we would like to use the DLP2010EVM-LC for outdoor metrology where the light conditions are unconstant. The system moves from location to location whereas the effect of light changes. Is the DLP2010EVM-LC capable to provide a solid pattern for high-accuarcy metrology (height, width, depth)?

We were experimenting with more simple light sources but the changing of effect of light destroyed the pattern and did not allow high-accuracy metrology.

Also is there a recommended camera EVM for high-accuracy metrology / high-accuracy 3D scanning?

Best regards

Bruno