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DLPNIRNANOEVM: DLPNIRNANOEVM error : Scan or reference data interpret failed

Prodigy 140 points

Replies: 12

Views: 184

Part Number: DLPNIRNANOEVM

Hello,
I've taken my newly bought NirScan Nano EVM. Then I press Scan without changing any value, lamp get lighted on and after few second I've got Error message that says: "scan or reference data interpreted failed". No spectra was displayed in graph. My PC OS  Windows7.
Any idea why is this happening and how can I fix that?
           
  • Hi Leo, 

    Welcome to TI E2E Forums! Our expert will look at your query and get back soon. 



    Regards,

    Mayank

  • In reply to Mayank Khandelwal:

    Hello Leo,

    The bottom of the GU I screen there are button there is row of radio knobs with error status. Could you please check which one is active when error occurs,

    regards,

    Vivek

  • In reply to Vivek Thakur:

    Hello Vivek,

    Thank you for your response。

    The button doesn't work。 I can't do anything about it.  please check out the images。

    I bought two devices at the same time. The other device is working.      But this one, it's the same mistake every time。

    I bought these two devices in March 2020.

    Leo

  • In reply to Leo Zhengxiaochao:

    Hi Leo,

    Can you please try the following on the affected unit and report back the results?

    1. Connect EVM to PC
    2. Select 'New' in the "Scan Reference Select" area
    3. Hold some white reflective material against the window
    4. Press 'Scan'
    5. Verify that after a successful previous 'new' reference scan, the GUI has changed to 'Previous' in the "Scan Reference Select" area
    6. Hold a different material against the window
    7. Press 'Scan'
    8. View spectrum. Note that the absorbance might be negative if the material used in step 6 reflected more light than the material used in step 3 at any of the wavelengths.

    The text of the error suggests there is a possibility that the stored reference scan is either not getting retrieved properly from the selected source ('Factory' is selected in your screenshot). So by manually taking a temporary reference from the GUI, we can bypass that issue and verify that is the problem.

  • In reply to Eric Pruett:

    Hi Eric,

    Thank you for your reply.

    I have a test using your method。

    1. I've got the data。GUI has changed to 'Previous' in the "Scan Reference Select" area。 " figure 1 ".    ( Abnormal equipment )

    2. The results from the normal equipment          "  figure 2 ".     (Normal equipment)

    I have three devices   The data collected by this Abnormal device is inconsistent with that of other devices.

    What am I gonna do now?

  • In reply to Leo Zhengxiaochao:

    Hello Leo,

    from your post it is not clear if you did following steps on the unit 1 (abnormal)

    1. Connect EVM to PC
    2. Select 'New' in the "Scan Reference Select" area
    3. Hold some white reflective material against the window
    4. Press 'Scan

    You need to first scan a standard white reflective material with above setting.  The result of this scan will be used as reference scan in the next step :

    5.Verify that after a successful previous 'new' reference scan, the GUI has changed to 'Previous' in the "Scan Reference Select" area

    6.Hold a different material against the window

    7.Press 'Scan'

    Please note that the value in first step are used a reference value and absorbance is calculated  against this refrecne.

    Could you please also post screen capture with "intensity" selected. This will show the values of second scan independent of reference value.

    regards,

    Vivek

  • In reply to Vivek Thakur:

    Hello Vivek,

    by default of "Factory"

    1.Connect EVM to PC

    2.Select 'New' in the "Scan Reference Select" area

    3.Hold some white reflective material against the window

    4.Press 'Scan        

    5 Verify that after a successful previous 'new' reference scan, the GUI has changed to 'Previous' in the "Scan Reference Select" area

    6.Hold a different material against the window

    7. Press 'Scan'

    using another Nano remaining all other configs except "ref Factory"

    changing back to Nano with problem, using ref "Previous"

    please check out the data file ."test scan Ref Factory.rar"   "test scan Ref Previous.rar"

    test scan Ref Factory.rartest scan Ref Previous.rar

    Leo

  • In reply to Leo Zhengxiaochao:

    Hello Leo,

    Thank you for your patient and working with me to diagnose this problem. It seems that system is having problem with factory reference value. Either the data is incorrect or it is not able to read the calibration data.

    Could you please run one more experiment?

    Lets overwrite the factory calibration 

      Step 1- over write factory calibration

      - Hold white reflective surface against window

     - Click on utility tab on GUI

     - Click "scan" button in Replace Reference Calibration window

    After you overwritten factory reference and assume it successful, please run scan with with factory refrnece.

    Please upload the CSV file. It easier to work with.

    regards,

    Vivek

  • In reply to Vivek Thakur:

    hello Vivek,

    step 1 open replacing calibration 

    step 2 scanning on white paper

    after scanning showing as

    step 3 scanning a sample by "ref Facotory"

    step 4, changed to another proper-working Nano, scanning same sample

     the CSV file:

    TI Data.rar

    Leo

  • In reply to Leo Zhengxiaochao:

    Hello Leo,

    Thank you for  working with me. Based on these experiments, it seems that factory reference values stored in the EVM got corrupted.   You are able to write new factory reference values. If you write factory reference with 99% NIR reflective standards like Lab sphere on the bad unit. You see will consistent result between two units. 

    https://www.labsphere.com/labsphere-products-solutions/materials-coatings-2/targets-standards/diffuse-reflectance-standards/wavelength_standards/

    The absorbance plot between  two  units are different because the  reference spectrum is not correct. The reference spectrum represents the light intensity when it is reflected back from a 99% or higher reflective surface. If you look at the profile of the intensity values between two units, they will appear similar. However actual value may be different because of  variation in lamp performance. 

    If you have access to reflective standards then please take new factory reference with the standards. It should resolve all  issues you are seeing.

    In case you do not have such standards, you may want to buy at least one 99% reflective standard. The lamp used in EVM age with time and their performance profile changes with time and environment factors like temperature, humidity etc.  It is always a good idea to take frequent reference scan for consistent performance.

    regards,

    Vivek

     

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