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DLPNIRNANOEVM: Measurement speed

Part Number: DLPNIRNANOEVM

I have an application for NIRScan nano where measurement rate is important. To speed up the measurement when using GUI I have made a slew scan configuration comprizing 4 sections with each 6 wavelengths and 0.635ms exposure time. For measuring these 24 wavelengths the GUI says "Scan time was 0.220 seconds". When running back to back scans they are just measured each 5-10 seconds.

What can I do to enhance the measurement speed?

Is it possible to store back to back scans at SDcard located on the EVM?

BR/Håkan