Hi TI Experts,
Please let me confirm the following question.
Now my customer development the C5517 with using the Audio connected Framework for C55x device. As you know, this Framework is made for C5515 or C5535 devices and TI did not provide it for C5517. So, they have been porting it to C5517, but they have met the following issue.
[Issue]
The EP1TX interrupt happen twice within a very short time when C5517 run in 200MHz.
In normally, the EP1TX interrupt will happen every 1ms. But when C5517 run in 200MHz, EP1TX interrupt happened after 40us, and it cause the problem for FIFO data.
Note:
- If C5517 run in 100MHz, this issue did not occur.
- When inserted the delay cycles on USB AC task, not happened this issue.
- If used the low sampling rate under 16kHz, not happned it.
Would you please advice in order to resolve this issue? Do you know the way to avoide "the interrupt in short time"?
And have you ever seen this issue?
If you have any questions, please let me know.
Best regards.
Kaka