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Getting error while trying to connect evm6678l using CCS 5.1

Other Parts Discussed in Thread: TMS320C6678

Hi,

I want to reprogram the FPGA using DSP with CCS connected. So, I am trying to connect evm6678l through CCS 5.1 but getting following error(given below) while trying to connect to the core 0. I am using XDS100v1 USB simulator and have already checked the hardware setup of the board.

Error connecting to the target:
(Error -2131 @ 0x0)
Unable to access device register. Reset the device, and retry the operation. If error persists, confirm configuration, power-cycle the board, and/or try more reliable JTAG settings (e.g. lower TCLK).
(Emulation package 5.0.520.0)

When I tested the connection, I got following report:

Execute the command:

%ccs_base%/common/uscif/dbgjtag.exe -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

[Result]


-----[Print the reset-command software log-file]-----------------------------

This utility has selected a 100- or 510-class product.
This utility will load the adapter 'jioserdesusb.dll'.
The library build date was 'Oct 27 2011'.
The library build time was '17:12:35'.
The library package version is '5.0.520.0'.
The library component version is '35.34.38.0'.
The controller does not use a programmable FPGA.
The controller has a version number of '4' (0x00000004).
The controller has an insertion length of '0' (0x00000000).
This utility will now attempt to reset the controller.
This utility has successfully reset the controller.

-----[Print the reset-command hardware log-file]-----------------------------

The scan-path will be reset by toggling the JTAG TRST signal.
The controller is the FTDI FT2232 with USB interface.
The link from controller to target is direct (without cable).
The software is configured for FTDI FT2232 features.
The controller cannot monitor the value on the EMU[0] pin.
The controller cannot monitor the value on the EMU[1] pin.
The controller cannot control the timing on output pins.
The controller cannot control the timing on input pins.
The scan-path link-delay has been set to exactly '0' (0x0000).

-----[The log-file for the JTAG TCLK output generated from the PLL]----------

There is no hardware for programming the JTAG TCLK frequency.

-----[Measure the source and frequency of the final JTAG TCLKR input]--------

There is no hardware for measuring the JTAG TCLK frequency.

-----[Perform the standard path-length test on the JTAG IR and DR]-----------

This path-length test uses blocks of 512 32-bit words.

The test for the JTAG IR instruction path-length failed.
The JTAG IR instruction scan-path is stuck-at-ones.

The test for the JTAG DR bypass path-length failed.
The JTAG DR bypass scan-path is stuck-at-ones.

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG IR Integrity scan-test has failed.

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

This test will use blocks of 512 32-bit words.
This test will be applied just once.

Do a test using 0xFFFFFFFF.
Scan tests: 1, skipped: 0, failed: 0
Do a test using 0x00000000.
Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
The details of the first 8 errors have been provided.
The utility will now report only the count of failed tests.
Scan tests: 2, skipped: 0, failed: 1
Do a test using 0xFE03E0E2.
Scan tests: 3, skipped: 0, failed: 2
Do a test using 0x01FC1F1D.
Scan tests: 4, skipped: 0, failed: 3
Do a test using 0x5533CCAA.
Scan tests: 5, skipped: 0, failed: 4
Do a test using 0xAACC3355.
Scan tests: 6, skipped: 0, failed: 5
Some of the values were corrupted - 83.3 percent.

The JTAG DR Integrity scan-test has failed.

Does this means that there is problem in the board with JTAG? If yes, than what is the other way of programming the same board. 

 

Thank you

  • Hi,

    Welcome to the TI E2E forum. I hope you will find many good answers here and in the TI.com documents and in the TI Wiki Pages (for processor issues). Be sure to search those for helpful information and to browse for the questions others may have asked on similar topics (e2e.ti.com). Please refer all the links below my signature.

    Please provide below information to help you.

     Are you working on EVM or custom board?

    Please attach your target configuration file.

    Thank you.

  • I am working on evm. Here is my config file:

    sion="1.0" encoding="UTF-8" standalone="no"?>
    <configurations XML_version="1.2" id="configurations_0">


    <configuration XML_version="1.2" id="Texas Instruments XDS100v1 USB Emulator_0">
    <instance XML_version="1.2" desc="Texas Instruments XDS100v1 USB Emulator_0" href="connections/TIXDS100usb_Connection.xml" id="Texas Instruments XDS100v1 USB Emulator_0" xml="TIXDS100usb_Connection.xml" xmlpath="connections"/>
    <connection XML_version="1.2" id="Texas Instruments XDS100v1 USB Emulator_0">
    <instance XML_version="1.2" href="drivers/tixds100icepick_d.xml" id="drivers" xml="tixds100icepick_d.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds100c66xx.xml" id="drivers" xml="tixds100c66xx.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds100cs_dap.xml" id="drivers" xml="tixds100cs_dap.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds100csstm.xml" id="drivers" xml="tixds100csstm.xml" xmlpath="drivers"/>
    <instance XML_version="1.2" href="drivers/tixds100etbcs.xml" id="drivers" xml="tixds100etbcs.xml" xmlpath="drivers"/>
    <platform XML_version="1.2" id="platform_0">
    <instance XML_version="1.2" desc="TMS320C6678_0" href="devices/C6678.xml" id="TMS320C6678_0" xml="C6678.xml" xmlpath="devices"/>
    <device HW_revision="1" XML_version="1.2" description="C66x core" id="TMS320C6678_0" partnum="TMS320C6678">
    <router HW_revision="1.0" XML_version="1.2" description="ICEPick_D Router" id="IcePick_D_0" isa="ICEPICK_D">
    <subpath id="subpath_0">
    <cpu HW_revision="1.0" XML_version="1.2" description="C66xx CPU" id="C66xx_0" isa="TMS320c66xx">
    <property Type="filepathfield" Value="..\..\..\..\CCSv5_4_0_00091\ccsv5\ccs_base\emulation\boards\evmc6678l\gel\evmc6678l.gel" id="GEL File"/>
    </cpu>
    </subpath>
    </router>
    </device>
    </platform>
    </connection>
    </configuration>
    </configurations>

  • Hi,

    Pleaase ensure to connect the onboard usb connector. Please refer below link for more detail.

    http://www.advantech.com/Support/TI-EVM/6678le_of.aspx

    TMDXEVM6678L - TMS320C6678 Lite Evaluation Module     The TMDXEVM6678L EVM comes with XDS100 onboard emulation capability. In addition, an external emulator via JTAG emulation header can be also be used.

    TMDXEVM6678LE - TMS320C6678 Lite Evaluation Module with XDS560V2 Emulation     The TMDXEVM6678LE EVM comes with XDS560V2 onboard emulation capability. The included XDS560 mezzanine card uses the TI 60-pin JTAG emulation header.

    Could you please share the "Test Connection" log for our analysis.

    Thank you.

    http://e2e.ti.com/support/dsp/c6000_multi-core_dsps/f/639/t/382721.aspx

  • I am using 6678L and have connected through XDS100 emulator. The "Test Connection" log is displayed above in the first post. 

  • Please share the test connection log. I have the same problem

  • Hi,

    The usb should have configured to act as RS232. Please revert the jumper settings on EVM for usb-jtag. Please refer section 2.14 of EVM's TRM from Advantech website for more information.

    Thank you.

  • I am still having problem with connecting c6678l using xds100v1 emulator. The jtag connection log is showing stuck-at faults for JTAG IR/DR test.
    Here is my log file again:


    Execute the command:

    %ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -F inform,logfile=yes -S pathlength -S integrity

    [Result]


    -----[Print the board config pathname(s)]------------------------------------

    C:\Users\mrinal\AppData\Local\TEXASI~1\CCS\
    TEXASI~1\0\0\BrdDat\testBoard.dat

    -----[Print the reset-command software log-file]-----------------------------

    This utility has selected a 100- or 510-class product.
    This utility will load the adapter 'jioserdesusb.dll'.
    The library build date was 'Mar 9 2014'.
    The library build time was '22:27:48'.
    The library package version is '5.1.450.0'.
    The library component version is '35.34.40.0'.
    The controller does not use a programmable FPGA.
    The controller has a version number of '4' (0x00000004).
    The controller has an insertion length of '0' (0x00000000).
    This utility will attempt to reset the controller.
    This utility has successfully reset the controller.

    -----[Print the reset-command hardware log-file]-----------------------------

    The scan-path will be reset by toggling the JTAG TRST signal.
    The controller is the FTDI FT2232 with USB interface.
    The link from controller to target is direct (without cable).
    The software is configured for FTDI FT2232 features.
    The controller cannot monitor the value on the EMU[0] pin.
    The controller cannot monitor the value on the EMU[1] pin.
    The controller cannot control the timing on output pins.
    The controller cannot control the timing on input pins.
    The scan-path link-delay has been set to exactly '0' (0x0000).

    -----[The log-file for the JTAG TCLK output generated from the PLL]----------

    There is no hardware for programming the JTAG TCLK frequency.

    -----[Measure the source and frequency of the final JTAG TCLKR input]--------

    There is no hardware for measuring the JTAG TCLK frequency.

    -----[Perform the standard path-length test on the JTAG IR and DR]-----------

    This path-length test uses blocks of 512 32-bit words.

    The test for the JTAG IR instruction path-length failed.
    The JTAG IR instruction scan-path is stuck-at-ones.

    The test for the JTAG DR bypass path-length failed.
    The JTAG DR bypass scan-path is stuck-at-ones.

    -----[Perform the Integrity scan-test on the JTAG IR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG IR Integrity scan-test has failed.

    -----[Perform the Integrity scan-test on the JTAG DR]------------------------

    This test will use blocks of 512 32-bit words.
    This test will be applied just once.

    Do a test using 0xFFFFFFFF.
    Scan tests: 1, skipped: 0, failed: 0
    Do a test using 0x00000000.
    Test 2 Word 0: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 1: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 2: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 3: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 4: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 5: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 6: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    Test 2 Word 7: scanned out 0x00000000 and scanned in 0xFFFFFFFF.
    The details of the first 8 errors have been provided.
    The utility will now report only the count of failed tests.
    Scan tests: 2, skipped: 0, failed: 1
    Do a test using 0xFE03E0E2.
    Scan tests: 3, skipped: 0, failed: 2
    Do a test using 0x01FC1F1D.
    Scan tests: 4, skipped: 0, failed: 3
    Do a test using 0x5533CCAA.
    Scan tests: 5, skipped: 0, failed: 4
    Do a test using 0xAACC3355.
    Scan tests: 6, skipped: 0, failed: 5
    Some of the values were corrupted - 83.3 percent.

    The JTAG DR Integrity scan-test has failed.

    [End: Texas Instruments XDS100v1 USB Emulator_0]

    I am using on-board usb connector and have verified the switch and jumper settings.
  • Hi Mrinal,
    My suggestion is to start new a thread in CCS forum for further assistance. Please do not forget to post all the information there for faster resolution.
    Thank you.