Hi team,
Customer have made test on 6424 with bsdl file as attached and find on chip failed at boundary scan test.
This board test passed at functional test, but failed at boundary scan test, so it’s not assembly/SMT problems obviously.
For boundary scan test, chip ID test and bypass mode passed, but can’t enter preload/sample boundary scan mode, and we verified them at 2 different boundary scan platform(Goepel and ASSET scanworks), failed message shows that boundary scan length isn’t correct(normally cell length is 550, but test result isn’t 550, see attached bsdl file).
Btw, customer request Goepel expert to analyze this problem on line, here is the relay:
"It looks like this for me:
There is no problem to read out the id (after power up).
There is no problem if the device is in bypass mode.
That means for me the wiring is OK.
But if the device should go to sample, preload or extest mode it does not works. It looks for me that not the right command is used and also seems than the number of bscan cells is not 550 for these commands."
And Customer have require Ti to made FA test, but the test report haven't identify the boundary scan test error.
Could you please provide some advise? thanks!
BR,
Denny
