Hi,
According to the DS document, the part implements some features that helps to debug the TMDS link.
First, the part has TMDS error detection capability so BER counters are provided for each the lane.
Next, the part can be put to pattern verification mode where it monitors selected TMDS Rx lane looking for specified data sequence and evaluates it.
Beside, the part can be switched to the pattern generating mode where it outputs internally-generated test data (PRBS or custom) via the TMDS Tx pins. Which implies the part does not pass received TMDS data to the Tx pins any more.
Could TI share with us some details that are not clear from the DS:
1. How to put the part to the pattern generating mode?
2. When the pattern generating mode is activated, if the part is still able to detect errors in Rx data? In the other words, if the BER counters are operating as usual?
3. TI offers the Eye Scan visual tool that is intended to work with evaluation boards, which are equipped with the USB-to-I2C bridge (based on TUSB3410). If TI has a interface specification document for that bridge (USB descriptor set, etc.) that helps customers to implement the bridge in the target system firmware?
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regards,
Igor
