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ISO7841: Reliability reports, radiation tests, FIT rates

Vincent LORENTZ
Intellectual 320 points
Part Number: ISO7841
Other Parts Discussed in Thread: ISO7741-Q1

Dear TI Support,

we are currently looking for the FIT rate of the ISO78xx digital isolators. Further, we would be interested in the reliability report, including latch-up immunity and SEU. Do you have any useful documents that could help us further?

Many thanks in advance

Vincent

  • 0
    TI__Mastermind 49365 points
    Hi Vincent,

    Thank you for using E2E forum and for showing interest in ISO7841. Please find below the reliability data for ISO7841. Regarding your other questions, please allow me to come back to you. Meanwhile could you please explain what is SEU? I would be checking with the team on this as well but it would be helpful if you could let me know. Thanks.

    MTBF : 2.50E+09
    FIT RATE : 0.4
    CONF LEVEL : 60%
    USAGE TEMP : 55C


    Regards,
    Koteshwar Rao
  • 0 in reply to Koteshwar Rao
    Intellectual 320 points

    Thank you very much, Koteshwar. This sound perfect.

    Could you confirm that these numbers are also the same for the ISO7741-Q1?

    Best regards

    Vincent

  • 0 in reply to Vincent LORENTZ
    TI__Mastermind 49365 points

    Hi Vincent,

    Yes, the numbers are going to be the same for ISO7741-Q1 as well as they both belong to the same family. Thanks.


    Regards,
    Koteshwar Rao

  • 0 in reply to Koteshwar Rao
    TI__Mastermind 49365 points
    Hi Vincent,

    I checked internally find out the latch-up tests that we do on our devices. We run latch-up tests per JESD78 and we haven't seen fails on this.

    Regarding SEU, I couldn't find out what exactly is SEU. If you could share more details on SEU then I can try to get you the information you have requested. Thanks.


    Regards,
    Koteshwar Rao
  • 0 in reply to Koteshwar Rao
    Intellectual 320 points

    Dear Koteshwar,

    many thanks for lokking and searching for these very important information for us.

    It is excellent, that you did not get any latch-up with the JESD78 test.

    SEU stays for SIngle Event Upset: it is a change of state caused by one single ionizing particle (ions, electrons, photons, etc...). It is very common in aerospace applications (especially in space), but also become important in aviation or such kind of application (like airships) staying in the sky at high altitudes (16-35km) during long times (3 days to 12 months). Any information on this would greatly help us, since we intend to use these isolators in such research applications.

    Many thanks in advance.

    Best regards

    Vincent

  • 0 in reply to Vincent LORENTZ
    TI__Mastermind 49365 points
    Hi Vincent,

    Apologies for the delayed response. Our product line primarily produces isolators for industrial and automotive applications and SEU is not part of our qualification process. I did reach out to High Reliability team within TI that produces space grade devices and understood a little bit about SEU. I am sorry that I do not have this information for you. Please do let us know if you need any support (new post if different from current subject), thanks.


    Regards,
    Koteshwar Rao