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Part Number: ISO7841
Dear TI Support,
we are currently looking for the FIT rate of the ISO78xx digital isolators. Further, we would be interested in the reliability report, including latch-up immunity and SEU. Do you have any useful documents that could help us further?
Many thanks in advance
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In reply to Koteshwar Rao:
Thank you very much, Koteshwar. This sound perfect.
Could you confirm that these numbers are also the same for the ISO7741-Q1?
In reply to Vincent LORENTZ:
Hi Vincent, Yes, the numbers are going to be the same for ISO7741-Q1 as well as they both belong to the same family. Thanks. Regards, Koteshwar Rao
many thanks for lokking and searching for these very important information for us.
It is excellent, that you did not get any latch-up with the JESD78 test.
SEU stays for SIngle Event Upset: it is a change of state caused by one single ionizing particle (ions, electrons, photons, etc...). It is very common in aerospace applications (especially in space), but also become important in aviation or such kind of application (like airships) staying in the sky at high altitudes (16-35km) during long times (3 days to 12 months). Any information on this would greatly help us, since we intend to use these isolators in such research applications.
Many thanks in advance.
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