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SN74LVC1G17MDCK Latch up Failure

Hello,

I am using the SN74LVC1G17MDCK part in my design. I am doing some hot spot analysis under single failure conditions.

The failure assumed here is the latch up failure of this gate. This gate is powered by 3.3V rail capable of sourcing 3A.

My question is, Can the latch up failure result in a partial short across the supply terminal of this gate and draw enough current to be a hot spot in excess of 200degC and not pull down the rail i.e. it remains latent if the gate output is stuck in the expected state?

Awaiting the response.

Regards, Infant Jesuraj

  • Hi Infant ,

    I believe there are chances that device can heat up to 200C given the sourcing could go up to 3A, but I cannot guarantee the state will be stuck high or low. I will have to check with the product engineers and get back to you.