Hi,
I would like to confirm that under the MSP430 ADC calibration mode(when SD24CAL = 1), negative values offset can be measured. The reason why I am asking this is, so far, no negative value offset data is collected and there are a few prototype boards with offset compensation error. These error and seems to be due to wrong signed offset value. Please see an example below for illustration :
Measured offset value = +10, //(SD24CAL = 1)
Raw measurement = 90
Actual measurement = Raw measurement - Measured offset value
Actual measurement = 90 - (+10) = 80
However, the expected value of the known sample should be 100 instead of the 80. Based on this, we are suspecting that the measured offset should be -10 instead of the +10. So we wish to confirm that the negative offset can be captured during calibration(SD24CAL = 1).
Thank you very much.
Regards,
Weiren