Morning,
I'm trying to evaluate the suitability of the TPS3808G01MDBVTEP part (-55 to 125'C rating with customisable threshold voltage).
To understand how susceptible the part may be to single event errors I was hoping you could share the size of the internal EEPROM so I can evaluate how likely these are to occur.
Secondly, I was wondering if this device contains any NOR or NAND technology, and if so, which.
Many thanks,
Alistair