Other Parts Discussed in Thread: LM5060-Q1,
My customer is having an issue with the destruction of his MOSFETs when they are running a test that shorts the device to GND. The part seems to operate properly except when they run this test. The issue is that they must run this test to meet their customer’s requirements.
There is a section in the data sheet that states:
In the event of a fault condition, the Latch-OFF current sink, 10uA typical, may not be able to discharge the total gate capacitance in a timely manner to prevent damage to the MOSFETs.
I believe that this might be the case with the customer. Can you explain this warning in greater detail?
Can he add any additional circuit that would allow the FET to be shut down faster? Would using a reverse diode in the drive circuit help?
Do you have any other suggestions that might help the customer?
Is there another way to run the short test that would provide the proper results and would not damage the external FET?
Would you recommend that the customer use another device?
Please let me know if you have any further questions.
Thanks for your help with this!
Richard Elmquist
