Dear all,
one of my AA is testing the LM5060-Q1 in his final equipment. Everything works fine at room temperature.
At -40degC the device shuts down the MOSFET even if there isn't an evidence of FAULT.
The designer has implemeted the back-to-back mosfet connection showed in the DS and has added a Ro at the OUT pin.
There is big suspect that the orgin of the fault is related to the change of RDSon of the external mosfet and the tolerance of Isense,Voffset, Iratio used in the formula (21) in the datasheet.
Can you please tell me which is the vlaue at -40degC of Iratio, Voffset and Isense ? From the electrical table in the DS is though the undrstand.
Moreover do you have any suggestions to take in account those non-idelaity in the formula (21) ?
regards,
Domenico