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TRF37C75 / about Power dissipation(MAX)

Other Parts Discussed in Thread: TRF37C75

Hi,

Customer is going to use TRF37C75 for mobile communication system.

So, would you please provide Power dissipation(MAX) value?

They strongly requests the data to estimate exactly the power consumption of their system.

Best Regards,

Kato

  • Would you please support our request? Customer is waiting the data.

  • Power dissipation is dependent on LO frequency of operation. You can check out the plot available in the datasheet for the information. -RJH

  • RJ Hopper -san,

    Thank you for the reply. How do we estimate the variation in manufacturing processes ?

    Would you please provide reference values ?

    Best Regards,

    Kato

  • Let me see if I can dig up some of the statistical data from ATE to provide a guage. --RJH
  • Please disregard my previous post related to Icc dependent on frequency; I was thinking about a different device. The ‘C75 current is very consistent over frequency and over devices. The Histogram of the Icc over devices is shown below. The variation is around +/- 2 mA. –RJH

     

    Icc(mA)                               #

    82                                         0

    83                                         0

    84                                         1

    85                                         17

    86                                         53

    87                                         33

    88                                         2

    89                                         0

    90                                         0

     

  • RJ Hopper - san,

    Thank you for providing the data. Are the samples(n=106) same wafer ? Is the wafer typcal ?

    Best Regards,

    Kato

  • Kato:

    Yes, the data is for devices from one production batch (multiple wafers).  At this time I do not have any data from multiple production runs so I cannot comment on lot-to-lot variation; however, given the simplicity of the circuit and the tight tolerance seen on existing data, I do not expect much variability due to process.

    --RJH

  • RJ Hopper - san,

    Thank you for the information.

    Could you provide us another  wafer lot's data ?

    Best Regards,

    Kato