Other Parts Discussed in Thread: FDC1004,
I have been developing software for the FDC1004 and have noticed an issue wherein CIN channels seem to "move" from one measurement to another after configuration, triggered by enabling and disabling of measurements. I initially noticed this in my software, but I believe I have reproduced the phenomenon on the EVM board and TI software as well.
The Setup
HW: FDC1004EVM
SW: Sensing Solutions EVM GUI
Configuration: Standard POR configuration
* All measurements enabled, MEASx={CINx, DISABLE}
* 100 Samples/sec, repeat enabled
Procedure
1. Place finger over "Right" sensor, note a significant capacitance increase on Measurement 1 {CIN1, DISABLE}
2. Place finger over "Left" sensor, note increase in Measurement 2
Already this doesn't make sense as the "Left" sensor is physically connected to channel CIN1 and the "Right" to CIN4, thus I would expect to see these increases show up in Measurement 1 and 4 respectively...
3. Disable Measurement 2, place finger over "Left" Sensor, note increase in Measurement 3 now...
I am clearly missing something, can anyone shed light on why this is occurring?
Thanks
