Hi,
I am try to measure the bit error rate in Low energy mode using Rhode & Schwarz CBT tester. Below are the setting in CBT
Packets=1500, RF Level= 0 dBm, TX Frequency= 2402 MHz, TX channel=0, Payload Pattern=PRBS9, Payload Length=8. The Image is also attached.
In the Bluetooth Side, i followed the procedure suggested in "CC256x Testing Guide" document for BER in LE mode
1) HCI_VS_LE_Enable 0xFD5B, 1, 1
2)HCI_VS_Write_Hardware_Register 0xFF01, 0x0019324E, 0x0
3)HCI_VS_Set_LE_Test_Mode_Parameters 0xFD77, 0x01, x01, 0x0000, 0x71764129(RX_AC), 0x01(Enable_BER), 0x00(PayloadType), 0x25(Payload_Length), 0x18(FA_THR_inBits), 0x00(En_Traces), 0x00E221E8 (CRC)
4) HCI_BLE_Receiver_Test 0x201d, 0(RX_Channel)
Now the packet is send from CBT and test is terminated by
5) HCI_BLE_Test_End 0x201f
6) Hci_VS_LE_Read_Ber_Test_Results 0xFDAE
7) HCI_VS_Read_Hardware_Register 0xFF00, 0x0019324E
The response got from Bluetooth chip is
04 0e 44 01 ae fd 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 00 dc 05 00 00 00 00 00 00 00 00 db 05 66 04 75 01 00 00 86 00 a1 00 c2 02 e9 01 09 00 00 00 00 00 00 00 00 00
When math is done , BER was 100% and total bad bits was 178325232
Does my procedure is right in testing the BER?
