Result Details:

Result Details
Mid Voltage0.000 V#Avgs128

Trial 1

Trial 1: +Vout

100 Base-TX, UTP -Vout Differential Output Voltage Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.2.2)

Test Summary: Pass Test Description: Vout is defined as the straight line best fit for amplitude. Here, Vout is measured over a 96ns pulse.
Pass Limits:(950.0 mV to 1.0500 V)-Vout-1.0188 V

Result Details:

Result Details
Mid Voltage0.000 V#Avgs128

Trial 1

Trial 1: -Vout

100 Base-TX, UTP Signal Amplitude Symmetry Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.4)

Test Summary: Pass Test Description: The ratio of the +Vout magnitude to -Vout magnitude shall be between the limits of 0.98 and 1.02
Pass Limits:(980 m to 1.020)Amplitude Symmetry-981 m

Result Details:

Result Details
+Vout999.8 mV-Vout-1.0188 V#Avgs128

Next

100 Base-TX, +Vout Overshoot Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.3)

Test Summary: Pass Test Description: We define overshoot as the percentage difference between the peak voltage of the waveform and the final adjusted value (VOut). The peak voltage is measured between the 50% transition crossing time from 0 to VOut and a point in time 8ns afterward. Overshoot 0s computed as (Vpeak - VOut)/VOut * 100 percent.
Pass Limits:< 5.0 %+Overshoot (%)600 m%

Result Details:

Result Details
VPeak1.0059 VVOut999.8 mV#Avgs128

Trial 1

Trial 1: +Overshoot (%)

100 Base-TX, -Vout Overshoot Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.3)

Result Details:

Result Details
VPeak1.0210 VVOut1.0188 V#Avgs128

Trial 1

Trial 1: -Overshoot (%)

100 Base-TX, UTP AOI Template Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Annex J)

Test Summary: Pass Test Description: The template is first centered vertically on the eye pattern baseline. It should be translated horizontally and scaled in amplitude for the best fit to the eye pattern. For UTP, the scaling factor must be between 0.95 and 1.05.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Eye TopAutofit Mask Scale995 mEye Top -- #Waveforms Tested100.0Eye Top -- Failure DetailsNo FailureEye Top(no value)Eye BottomAutofit Mask Scale1.015Eye Bottom -- #Waveforms Tested100.0Eye Bottom -- Failure DetailsNo FailureEye Bottom(no value)# Waveforms100

Trial 1

Trial 1: Eye Top -- No Failures

Trial 1: Eye Bottom -- No Failures

100 Base-TX, AOI +Vout Rise Time Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Test Summary: Pass Test Description: The AOI signal rise is defined as the transition from the baseline voltage (nominally 0V) to either +Vout or -Vout. The AOI rise and fall times (10/90) for +Vout and -Vout shall fall in the range of 3 to 5 ns. A number of rise/falltime measurements are made. The worst case is reported here.
Pass Limits:(3.000 ns to 5.000 ns)Worst Case Risetime3.885 ns

Result Details:

Result Details
Maximum Risetime3.891 nsMinimum Risetime3.885 nsAverage Risetime3.887 ns+Vout999.8 mV# Rise/Fall Avgs128# Rise/Fall Meas100

Trial 1

Trial 1: One +Vout Signal Rise (of 100.0 total)

100 Base-TX, AOI +Vout Fall Time Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Test Summary: Pass Test Description: The AOI signal fall is defined as the transition from the +Vout or -Vout to the baseline voltage (nominally 0V). The AOI rise and fall times (10/90) for +Vout and -Vout shall fall in the range of 3 to 5 ns. Note that this test uses 100 measurements. The reported "Actual Value" is the current/last measurement, The statistics (min/max) over 100 measurements are used to determine compliance.
Pass Limits:(3.000 ns to 5.000 ns)Worst Case Falltime3.694 ns

Result Details:

Result Details
Maximum Falltime3.700 nsMinimum Falltime3.694 nsAverage Falltime3.697 ns+Vout999.8 mV# Rise/Fall Avgs128# Rise/Fall Meas100

Trial 1

Trial 1: One +Vout Signal Fall (of 100.0 total)

100 Base-TX, AOI +Vout Rise/Fall Symmetry Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Test Summary: Pass Test Description: The difference between the maximum and minimum of all rise and fall times shall be less than or equal to 0.5ns. The statistics (min/max Rise/Falltime) over 100 measurements are used to determine compliance.
Pass Limits:< 500.00 ps+Vout, Worst Case Delta196.84 ps

Result Details:

Result Details
Min Risetime3.885 nsMax Risetime3.891 nsMin Falltime3.694 nsMax Falltime3.700 ns+Vout999.8 mV# Rise/Fall Avgs128# Rise/Fall Meas100

Next

100 Base-TX, AOI -Vout Rise Time Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Test Summary: Pass Test Description: The AOI signal rise is defined as the transition from the baseline voltage (nominally 0V) to either +Vout or -Vout. The AOI rise and fall times (10/90) for +Vout and -Vout shall fall in the range of 3 to 5 ns. Note that this test uses 100 measurements. The reported "Actual Value" is the current/last measurement, The statistics (min/max) over 100 measurements are used to determine compliance.
Pass Limits:(3.000 ns to 5.000 ns)Worst Case Risetime3.937 ns

Result Details:

Result Details
Maximum Risetime3.986 nsMinimum Risetime3.937 nsAverage Risetime3.943 ns-Vout-1.0188 V# Rise/Fall Avgs128# Rise/Fall Meas100

Trial 1

Trial 1: One -Vout Signal Rise (of 100.0 total)

100 Base-TX, AOI -Vout Fall Time Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Result Details:

Result Details
Maximum Falltime3.732 nsMinimum Falltime3.729 nsAverage Falltime3.730 ns-Vout-1.0188 V# Rise/Fall Avgs128# Rise/Fall Meas100

Trial 1

Trial 1: One -Vout Signal Fall (of 100.0 total)

100 Base-TX, AOI -Vout Rise/Fall Symmetry Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Result Details:

Result Details
-Vout-1.0188 VMinimum Risetime3.937 nsMaximum Risetime3.986 nsMinimum Falltime3.729 nsMaximum Falltime3.732 ns# Rise/Fall Avgs128# Rise/Fall Meas100

Next

100 Base-TX, AOI Overall Rise/Fall Symmetry Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.6)

Result Details:

Result Details
Min Rise/Falltime3.694 nsMax Rise/Falltime3.986 ns# Rise/Fall Avgs128# Rise/Fall Meas100

Next

100 Base-TX, Transmit Jitter Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.9)

Test Summary: Pass Test Description: Total Transmit jitter, including contributions from duty cycle distortion and Baseline Wander shall not exceed 1.4 ns peak-to-peak.
Pass Limits:< 1.400 nsPkPk Transmit Jitter (ns)392 ps

Result Details:

Result Details
Top Crossing Min-181.6 psTop Crossing Max119.8 psTop Crossing Width301 psBottom Crossing Min-255.3 psBottom Crossing Max136.7 psBottom Crossing Width392 psTotal UI Measured1.024960e+005 (2.434400e+004 actual crossings)Minimum #Jitter UI requested100,000

Trial 1

Trial 1: Top Crossing Width

Trial 1: Bottom Crossing Width

100 Base-TX, Duty Cycle Distortion Reference: IEEE Std. 802.3ae (ANSI X3.263-1995, Section 9.1.8)

Test Summary: Pass Test Description: The deviations of the 50 crossing times from a best fit to a time grid of 16 ns spacing shall not exceed +/- 0.25 ns. The peak-to-peak Duty Cycle Distortion shall not exceed 0.5ns
Pass Limits:<= 500.000 psPkPk Duty Cycle Distortion54.180 ps

Result Details:

Result Details
t1-t016.054180 nst2-t115.986320 nst3-t215.988900 ns

Trial 1

Trial 1: DCD Waveform (PkPk DCD=5.418000e+001ps)

Test Configuration Details
Device Description
ReturnLossTest	Use Vector Network Analyzer
DisturberSource	Use Keysight 33250A
Test Session Details
Infiniium SW Version	06.10.01001
Infiniium Model Number	DSOS254A
Infiniium Serial Number	MY57500112
Application SW Version	2.50
Debug Mode Used	No
Compliance Limits (official)	IEEE Std. 802.3ae Specification
Probe (Channel 1)	Model: N2795A Serial: DE51271381 Atten: Calibrated (29 MAY 2019 11:05:56), Using Cal Atten (9.8625E+00) Skew: Calibrated (29 MAY 2019 11:05:40), Using Cal Skew
Probe (Channel 2)	Model: N2795A Serial: DE51421560 Atten: Calibrated (29 MAY 2019 16:50:58), Using Cal Atten (9.8975E+00) Skew: Calibrated (29 MAY 2019 16:50:45), Using Cal Skew
Probe (Channel 3)	Model: 1134A Serial: US55011125 Head: E2678A/B Atten: Calibrated (30 MAY 2019 10:08:04), Using Cal Atten (9.9879E+00) Skew: Calibrated (30 MAY 2019 10:08:12), Using Cal Skew
Probe (Channel 4)	Model: 10:1 1M Ohm Probe Serial: No Serial Num Atten: Calibrated (29 MAY 2019 14:53:06), Using Cal Atten (1.0008E+01) Skew: Calibrated (29 MAY 2019 14:52:58), Using Cal Skew
Last Test Date	2019-05-30 10:52:25 UTC +08:00

Test Statistics
Failed	0
Passed	15
Total	15

Margin Thresholds
Warning	< 2 %
Critical	< 0 %

Pass	# Failed	# Trials	Test Name	Actual Value	Margin	Pass Limits
	0	1	100 Base-TX, UTP +Vout Differential Output Voltage	999.8 mV	49.8 %	950.0 mV < VALUE < 1.0500 V
	0	1	100 Base-TX, UTP -Vout Differential Output Voltage	-1.0188 V	31.2 %	950.0 mV < \|VALUE\| < 1.0500 V
	0	1	100 Base-TX, UTP Signal Amplitude Symmetry	-981 m	2.5 %	980 m < \|VALUE\| < 1.020
	0	1	100 Base-TX, +Vout Overshoot	600 m%	88.0 %	VALUE < 5.0 %
	0	1	100 Base-TX, -Vout Overshoot	200 m%	96.0 %	VALUE < 5.0 %
	0	1	100 Base-TX, UTP AOI Template	0.000	100.0 %	No Mask Failures
	0	1	100 Base-TX, AOI +Vout Rise Time	3.885 ns	44.3 %	3.000 ns < VALUE < 5.000 ns
	0	1	100 Base-TX, AOI +Vout Fall Time	3.694 ns	34.7 %	3.000 ns < VALUE < 5.000 ns
	0	1	100 Base-TX, AOI +Vout Rise/Fall Symmetry	196.84 ps	60.6 %	VALUE < 500.00 ps
	0	1	100 Base-TX, AOI -Vout Rise Time	3.937 ns	46.9 %	3.000 ns < VALUE < 5.000 ns
	0	1	100 Base-TX, AOI -Vout Fall Time	3.729 ns	36.5 %	3.000 ns < VALUE < 5.000 ns
	0	1	100 Base-TX, AOI -Vout Rise/Fall Symmetry	257.08 ps	48.6 %	VALUE < 500.00 ps
	0	1	100 Base-TX, AOI Overall Rise/Fall Symmetry	292.09 ps	41.6 %	VALUE < 500.00 ps
	0	1	100 Base-TX, Transmit Jitter	392 ps	72.0 %	VALUE < 1.400 ns
	0	1	100 Base-TX, Duty Cycle Distortion	54.180 ps	89.2 %	VALUE <= 500.000 ps

Summary of Results

Report Detail