Test Report

Overall Result: PASS

Test Configuration Details
Device Description
Test Mode |
    Host
10G |
    No
5G |
    Yes
Reference Clock Option |
    SSC
TypeOFDUT |
    Gen 1
User defined S-parameter file |
    C:\Users\Public\Documents\Infiniium\Apps\USB3Test\TransferFunctions\U7242A_Deembed__USB3_TX_Host_Channel.tf4
User defined SSP S-parameter file |
    C:\Users\Public\Documents\Infiniium\Apps\USB3Test\TransferFunctions\N7015A_Deembed__TypC_TypC_14p1dbAt5GHz_Embed.tf4
Test Session Details
Infiniium SW Version |
    6.10.1001.0
Infiniium Model Number |
    DSOX92504A
Infiniium Serial Number |
    MY55040101
Application SW Version |
    3.93.9017.0
Debug Mode Used |
    No
Compliance Limits |
    USB 3.1 Specification version 1.0 (official)
Probe (Channel 1) |
    Model: User Defined Probe
    Serial: No Serial Num

    Atten: Calibrated (24 APR 2019 10:57:00), Using Cal Atten (1.0108E+00)
    Skew: Calibrated (24 APR 2019 10:57:07), Using Cal Skew
Probe (Channel 2) |
    Model: User Defined Probe
    Serial: No Serial Num

    Atten: Calibrated (18 APR 2019 09:29:44), Using Cal Atten (1.0109E+00)
    Skew: Calibrated (18 APR 2019 09:29:55), Using Cal Skew
Probe (Channel 3) |
    Model: User Defined Probe
    Serial: No Serial Num

    Atten: Calibrated (24 APR 2019 10:57:59), Using Cal Atten (1.0052E+00)
    Skew: Calibrated (24 APR 2019 10:58:06), Using Cal Skew
Last Test Date |
    2019-04-24 13:28:14 UTC +08:00

## Summary of Results

Test Statistics
Failed | 0
Passed | 22
Total | 22

Margin Thresholds
Warning | < 2 %
Critical | < 0 %

Pass | # Failed | # Trials | Test Name | Actual Value | Margin | Pass Limits
| 0 | 1 | 5G LFPS Peak-Peak Differential Output Voltage | 987.5 mV | 46.9 % | 800.0 mV <= VALUE <= 1.2000 V
| 0 | 1 | 5G LFPS Period (tPeriod) | 63.9890 ns | 45.0 % | 20.0000 ns <= VALUE <= 100.0000 ns
| 0 | 1 | 5G LFPS Burst Width (tBurst) | 1.0928 µs | 38.4 % | 600.0 ns <= VALUE <= 1.4000 µs
| 0 | 1 | 5G LFPS Repeat Time Interval (tRepeat) | 11.0198 µs | 37.3 % | 6.0000 µs <= VALUE <= 14.0000 µs
| 0 | 1 | 5G LFPS Rise Time | 243.2 ps | 93.9 % | VALUE <= 4.0000 ns
| 0 | 1 | 5G LFPS Fall Time | 249.6 ps | 93.8 % | VALUE <= 4.0000 ns
| 0 | 1 | 5G LFPS Duty cycle | 49.9980 % | 50.0 % | 40.0000 % <= VALUE <= 60.0000 %
| 0 | 1 | 5G LFPS AC Common Mode Voltage | 66.2 mV | 33.8 % | VALUE <= 100.0 mV
| 0 | 1 | 5G TSSC-Freq-Dev-Min | -4.747355 kppm | 34.5 % | -5.300000 kppm <= VALUE <= -3.700000 kppm
| 0 | 1 | 5G TSSC-Freq-Dev-Max | 130.017 ppm | 28.3 % | TSSCMin ppm <= VALUE <= TSSCMax ppm
| 0 | 1 | 5G SSC Modulation Rate | 32.002470 kHz | 33.3 % | 30.000000 kHz <= VALUE <= 33.000000 kHz
| 0 | 1 | 5G SSC Slew Rate | 4.859 ms | 51.4 % | VALUE <= 10.000 ms
|  | 1 | 5G Short Channel Random Jitter | 1.854 ps |  | Information Only
| 0 | 1 | 5G Short Channel Maximum Deterministic Jitter | 47.337 ps | 45.0 % | VALUE <= 86.000 ps
| 0 | 1 | 5G Short Channel Total Jitter at BER-12 | 73.424 ps | 44.4 % | VALUE <= 132.000 ps
| 0 | 1 | 5G Short Channel Template Test | 0.000 | 100.0 % | VALUE = 0.000
| 0 | 1 | 5G Short Channel Differential Output Voltage | 285.5 mV | 16.9 % | 100.0 mV <= VALUE <= 1.2000 V
|  | 1 | 5G Random Jitter (CTLE ON) | 1.842 ps |  | Information Only
| 0 | 1 | 5G Far End Maximum Deterministic Jitter (CTLE ON) | 73.315 ps | 14.8 % | VALUE <= 86.000 ps
| 0 | 1 | 5G Far End Total Jitter at BER-12 (CTLE ON) | 99.223 ps | 24.8 % | VALUE <= 132.000 ps
| 0 | 1 | 5G Far End Template Test (CTLE ON) | 0.000 | 100.0 % | VALUE = 0.000
| 0 | 1 | 5G Far End Differential Output Voltage (CTLE ON) | 217.5 mV | 10.7 % | 100.0 mV <= VALUE <= 1.2000 V

## Report Detail

Next
5G LFPS Peak-Peak Differential Output Voltage Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the peak-to-peak differential output voltage of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[800.0 mV to 1.2000 V]LPFS PeakToPeakVoltage (5G) [2100]987.5 mV
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5
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5G LFPS Period (tPeriod) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the period of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[20.0000 ns to 100.0000 ns]tPeriod (5G) [2105]63.9890 ns
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5
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5G LFPS Burst Width (tBurst) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-29)
Test Summary: Pass Test Description: The purpose of this test is to verify that the burst width (tBurst) of the Polling.LFPS signal is within the conformance limits specified in Table 6-29 of the USB 3.1 Specification, version 1.0
Pass Limits:[600.0 ns to 1.4000 µs]tBurst (5G) [2110]1.0928 µs
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5 Burst Width Screen Capture(See image)
Trial 1
Trial 1: Burst Width Screen Capture
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5G LFPS Repeat Time Interval (tRepeat) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-29)
Test Summary: Pass Test Description: The purpose of this test is to verify that the time interval when the next LFPS burst is transmitted (tRepeat) is within the conformance limits specified in Table 6-29 of the USB 3.1 Specification, version 1.0
Pass Limits:[6.0000 µs to 14.0000 µs]tRepeat (5G) [2115]11.0198 µs
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5 Repeat Interval Screen Capture(See image)
Trial 1
Trial 1: Repeat Interval Screen Capture
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5G LFPS Rise Time Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the rise time of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:<= 4.0000 ns LFPS Rise Time (5G) [2120]243.2 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5
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5G LFPS Fall Time Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the fall time of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:<= 4.0000 ns LFPS Fall Time (5G) [2125]249.6 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5
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5G LFPS Duty cycle Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the duty cycle of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[40.0000 % to 60.0000 %]LFPS Duty cycle (%) (5G) [2130]49.9980 %
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Num Bursts Processed 5
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5G LFPS AC Common Mode Voltage Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28)
Test Summary: Pass Test Description: The purpose of this test is to verify that the maximum voltage from Txp + Txn for both time and amplitude is within the limits as specified in Table 6-28 of the USB 3.1 specification
Pass Limits:<= 100.0 mV AC Common Mode Voltage (5G) [2140]66.2 mV
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)
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5G TSSC-Freq-Dev-Min Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC deviation is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification.
Pass Limits:[-5.300000 kppm to -3.700000 kppm]SSC Deviation (ppm) (5G) [2307]-4.747355 kppm
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Max UI (ppm)-4.707732 kppm Min UI (ppm)-4.747355 kppm SSC Profile(See image)
Trial 1
Trial 1: SSC Profile
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5G TSSC-Freq-Dev-Max Reference: USB 3.1 Specification, Rev 1.0 ( USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16 Refer to ECN 018 of USB3.0 specification if Radio Friendly SSC option is turned on. )
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC deviation is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification. If Radio Friendly SSC option is turned on, this test will verify SSC deviation is within the conformance limits specified in ECN 018 of USB3.0 specification.
Pass Limits:[TSSCMin ppm to TSSCMax ppm]Worst SSC Deviation (ppm) (5G) [2311]130.017 ppm
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Max UI (ppm)130.017 ppm Min UI (ppm)75.006 ppm PassLimit Min (TSSCMin)-300.000 ppm PassLimit Max (TSSCMax)300.000 ppm
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5G SSC Modulation Rate Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC modulation rate is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification.
Pass Limits:[30.000000 kHz to 33.000000 kHz]Modulation Rate (Hz) (5G) [2308]32.002470 kHz
Result Details:
Result Details
Modulation rate measurement Success ConfigChannel(no value)PDOPMute(no value)
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5G SSC Slew Rate Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.1, Table 6-17)
Test Summary: Pass Test Description: The purpose of this test is to ensure the combination of SSC and all other jitter sources within the bandwidth of the CDR must not exceed the allowed slew rate as listed in Table 6-17.
Pass Limits:<= 10.000 ms Max Slew Rate (5G) [2310]4.859 ms
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Slew Rate(See image)Min Phase-2.44 ms Max Phase 2.42 ms Test Pattern CP1
Trial 1
Trial 1: Slew Rate
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5G Short Channel Random Jitter Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Info Test Description: The purpose of this test is to verify that the measured random jitter, Rj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:Info Only RJ (5G) (Short Channel) [32282]1.854 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M Rj_rms 1.854 ps Rj_Total 26.087 ps Test Pattern CP1 Test Waveform(See image)
Trial 1
Trial 1: Test Waveform
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5G Short Channel Maximum Deterministic Jitter Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured deterministic jitter, Dj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 86.000 ps DJ (5G) (Short Channel) [32292]47.337 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M DJ_dd 47.337 ps Test Pattern CP0 Test Waveform(See image)
Trial 1
Trial 1: Test Waveform
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5G Short Channel Total Jitter at BER-12 Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured total jitter, Tj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 132.000 ps Tj at BER 10-12 (5G) (Short Channel) [32296]73.424 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M Tj at BER 10-12 73.424 ps Rj_rms(ps)1.854 ps DJ_dd(ps)47.337 ps RJ Test Pattern CP1 DJ Test Pattern CP0 TJ Equation TJ = DJ(CP0) + 14.069 * RJrms(CP1)
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5G Short Channel Template Test Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to perform an eye mask test at TP1 using the eye mask template as specified in table 6-19 of the USB 3.1 specification.
Pass Limits:= 0.000 Mask Test Failures (5G) (Short Channel) [32210]0.000
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M Non-Transition Failures 0.000 Transition Failures 0.000 Non-Transition Eye Diagram(See image)Transition Eye Diagram(See image)Total Failures 0.000 CTLE Index 1.000 DFE Tap 0.000 NonTrans Max Voltage 283 m NonTrans Min Voltage-284 m NonTrans Lower Margin Voltage-127 m NonTrans Upper Margin Voltage 128 m NonTrans Eye Height 355 m Trans Max Voltage 256 m Trans Min Voltage-256 m Trans Lower Margin Voltage-92 m Trans Upper Margin Voltage 94 m Trans Eye Height 285 m Maximum Peak to Peak Jitter 70 p Mean Recover UI 200.458 Min Eye Width 126.593 Composit Eye Height 285 m Composit Eye Location 500 m Min Time Between CrossOver 200 p Test Pattern CP0 Template File C:\ProgramData\Keysight\Infiniium\Apps\USB3Test\SigTest5G\templates\usb_3_5gb\USB_3_5Gb_CP0_RjIN_SHORT.dat
Trial 1
Trial 1: Non-Transition Eye Diagram
Trial 1: Transition Eye Diagram
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5G Short Channel Differential Output Voltage Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the differential output voltage measured at TP1 meets the minimum eye height as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:[100.0 mV to 1.2000 V]PeakToPeakVoltage (5G) (Short Channel) [32241]285.5 mV
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)
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5G Random Jitter (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Info Test Description: The purpose of this test is to verify that the measured random jitter, Rj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:Info Only RJ (5G) (Far End) (CTLE ON) [22820]1.842 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M Rj_rms 1.842 ps Rj_Total 25.908 ps Test Pattern CP1
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5G Far End Maximum Deterministic Jitter (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured deterministic jitter, Dj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 86.000 ps DJ (5G) (Far End) (CTLE ON) [22920]73.315 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M DJ_dd 73.315 ps Test Pattern CP0 OptDeembedMode5G Std A to Std B Embedded channel file U7242A_Deembed__USB3_TX_Host_Channel.tf4
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5G Far End Total Jitter at BER-12 (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured total jitter, Tj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 132.000 ps Tj at BER 10-12 (5G) (Far End) (CTLE ON) [22960]99.223 ps
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)Number of UI for USB3 Gen1 testing 1.000000000 M Tj at BER 10-12 99.223 ps Rj_rms(ps)1.842 ps DJ_dd(ps)73.315 ps RJ Test Pattern CP1 DJ Test Pattern CP0 TJ Equation TJ = DJ(CP0) + 14.069 * RJrms(CP1)
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5G Far End Template Test (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to perform an eye mask test at TP1 using the eye mask template as specified in table 6-19 of the USB 3.1 specification.
Pass Limits:= 0.000 Mask Test Failures (5G) (Far End) (CTLE ON) [22100]0.000
Result Details:
Result Details
Number of UI for USB3 Gen1 testing 1.000000000 M Non-Transition Failures 0.000 Transition Failures 0.000 Non-Transition Eye Diagram(See image)Transition Eye Diagram(See image)Total Failures 0.000 CTLE Index 1.000 DFE Tap 0.000 NonTrans Max Voltage 294 m NonTrans Min Voltage-293 m NonTrans Lower Margin Voltage-60 m NonTrans Upper Margin Voltage 57 m NonTrans Eye Height 217 m Trans Max Voltage 372 m Trans Min Voltage-375 m Trans Lower Margin Voltage-144 m Trans Upper Margin Voltage 133 m Trans Eye Height 376 m Maximum Peak to Peak Jitter 100 p Mean Recover UI 200.479 Min Eye Width 100.793 Composit Eye Height 217 m Composit Eye Location 500 m Min Time Between CrossOver 200 p Test Pattern CP0 Template File C:\ProgramData\Keysight\Infiniium\Apps\USB3Test\SigTest5G\templates\usb_3_5gb\USB_3_5Gb_CP0_RjIN.dat OptDeembedMode5G Std A to Std B Embedded channel file (5G)U7242A_Deembed__USB3_TX_Host_Channel.tf4 ConfigChannel(no value)PDOPMute(no value)
Trial 1
Trial 1: Non-Transition Eye Diagram
Trial 1: Transition Eye Diagram
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5G Far End Differential Output Voltage (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0 (USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19)
Test Summary: Pass Test Description: The purpose of this test is to verify that the differential output voltage measured at TP1 meets the minimum eye height as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:[100.0 mV to 1.2000 V]PeakToPeakVoltage (5G) (Far End) (CTLE ON) [22410]217.5 mV
Result Details:
Result Details
ConfigChannel(no value)PDOPMute(no value)
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