Test Report

Overall Result: PASS

Test Configuration Details
Test Session Details
Infiniium SW Version
06.10.01001
Infiniium Model Number
DSOX92504A
Infiniium Serial Number
MY55040104
Application SW Version
1.20.9021
Debug Mode Used
No
Probe (Channel 1)
Model: User Defined Probe
Serial: No Serial Num

Atten: Calibrated (17 JAN 2019 13:19:08), Using Cal Atten (1.0063E+00)
Skew: Calibrated (17 JAN 2019 13:19:18), Using Cal Skew
Probe (Channel 2)
Model: User Defined Probe
Serial: No Serial Num

Atten: Calibrated (17 JAN 2019 11:54:49), Using Cal Atten (1.0087E+00)
Skew: Calibrated (17 JAN 2019 11:54:58), Using Cal Skew
Probe (Channel 3)
Model: User Defined Probe
Serial: No Serial Num

Atten: Calibrated (17 JAN 2019 13:19:54), Using Cal Atten (1.0050E+00)
Skew: Calibrated (17 JAN 2019 13:20:04), Using Cal Skew
Probe (Channel 4)
Model: User Defined Probe
Serial: No Serial Num

Atten: Calibrated (17 JAN 2019 11:55:30), Using Cal Atten (1.0089E+00)
Skew: Calibrated (17 JAN 2019 11:55:40), Using Cal Skew
Last Test Date
2019-01-19 15:17:00 UTC +08:00

Summary of Results

Test Statistics
Failed0
Passed15
Total15

Margin Thresholds
Warning< 2 %
Critical< 0 %

Pass# Failed# TrialsTest NameActual ValueMarginPass Limits
01Signal Rise Time (20%-80%)45.46 ps33.7 % VALUE >= 34.00 ps
01Signal Fall Time (80%-20%)45.22 ps33.0 % VALUE >= 34.00 ps
01Transmitter Qsq75.9451.9 % VALUE >= 50.00
01Transmitter Qsq for Cu79.7926.5 % VALUE >= 63.10
01Voltage Modulation Amplitude for Cu (VMA)(p-p)545.85 mV82.0 % VALUE >= 300.00 mV
01Data Dependent Jitter (DDJ)(p-p)85.4 mUI14.6 % VALUE <= 100.0 mUI
01Data Dependent Pulse Width Shrinkage (DDPWS)(p-p)53.1 mUI3.5 % VALUE <= 55.0 mUI
01Uncorrelated Jitter (UJ)(RMS)9.2 mUI60.0 % VALUE <= 23.0 mUI
01Transmitter Waveform Dispersion Penalty for Cu (TWDPc)9.313 dBe13.0 % VALUE <= 10.700 dBe
01Output AC Common Mode Voltage (rms)5.68 mV62.1 % VALUE <= 15.00 mV
01Single Ended Voltage Range (Positive)-161 mV3.2 % -300 mV <= VALUE <= 4.000 V
01Single Ended Voltage Range (Negative)-159 mV3.3 % -300 mV <= VALUE <= 4.000 V
01Total Jitter (TJ)(p-p)212.8 mUI24.0 % VALUE <= 280.0 mUI
01Eye Mask Hit Ratio0.0000000100.0 % VALUE <= 50.0 µ
01Output AC Common Mode Voltage for Cu (rms)5.32 mV55.7 % VALUE <= 12.00 mV


Report Detail

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Signal Rise Time (20%-80%) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the 20%-80% rise time of a host TX output. 0% and 100% levels are defined as the logic 0 voltage level and logic 1 voltage level respectively.
Pass Limits:>= 34.00 psSignal Rise Time (20%-80%)45.46 ps
Result Details:
Result Details
Logic 0 Voltage-272 mVLogic 1 Voltage273 mVDataLaneLane1TestPattern8180
Trial 1
Trial 1: Signal Rise Time (20%-80%)

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Signal Fall Time (80%-20%) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the 80%-20% fall time of a host TX output. 0% and 100% levels are defined as the logic 0 voltage level and logic 1 voltage level respectively.
Pass Limits:>= 34.00 psSignal Fall Time (80%-20%)45.22 ps
Result Details:
Result Details
Logic 0 Voltage-272 mVLogic 1 Voltage273 mVDataLaneLane1TestPattern8180
Trial 1
Trial 1: Signal Fall Time (80%-20%)

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Transmitter Qsq Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the Qsq of a host TX output. Qsq is a measure of SNR of the output.
Pass Limits:>= 50.00Transmitter Qsq75.94
Result Details:
Result Details
Logic 0 Voltage-273 mVLogic 1 Voltage273 mVLogic 0 noise (rms)3.56 mVLogic 1 noise (rms)3.63 mVDataLaneLane1TestPattern8180
Trial 1
Trial 1: Logic 0 noise (rms)
Trial 1: Logic 1 noise (rms)

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Transmitter Qsq for Cu Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 33
Test Summary: Pass Test Description: Verifies the Qsq of a host TX output supporting passive direct attached cable. Qsq is a measure of SNR of the output.
Pass Limits:>= 63.10Transmitter Qsq for Cu79.79
Result Details:
Result Details
Logic 0 Voltage-272 mVLogic 1 Voltage274 mVLogic 0 noise (rms)3.75 mVLogic 1 noise (rms)3.06 mVDataLaneLane1TestPattern8180
Trial 1
Trial 1: Logic 0 noise (rms)
Trial 1: Logic 1 noise (rms)

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Voltage Modulation Amplitude for Cu (VMA)(p-p) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 33
Test Summary: Pass Test Description: Verifies the VMA of a host TX output supporting passive direct attached cable. VMA is the difference between the logic 0 and logic 1 levels of the output.
Pass Limits:>= 300.00 mVVoltage Modulation Amplitude for Cu (VMA)(p-p)545.85 mV
Result Details:
Result Details
Logic 0 Voltage-273 mVLogic 1 Voltage273 mVDataLaneLane1TestPattern8180
Trial 1
Trial 1: Logic 0 Voltage
Trial 1: Logic 1 Voltage

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Data Dependent Jitter (DDJ)(p-p) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the DDJ of a host TX output. Measurement is done using EZJIT.
Pass Limits:<= 100.0 mUIData Dependent Jitter (DDJ)(p-p)85.4 mUI
Result Details:
Result Details
Data Dependent Jitter (DDJ)(p-p)(no value)DataLaneLane1TestPatternPRBS9
Trial 1
Trial 1: Data Dependent Jitter (DDJ)(p-p)

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Data Dependent Pulse Width Shrinkage (DDPWS)(p-p) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the DDPWS of a host TX output. Measurement is done using EZJIT.
Pass Limits:<= 55.0 mUIData Dependent Pulse Width Shrinkage (DDPWS)(p-p)53.1 mUI
Result Details:
Result Details
Data Dependent Pulse Width Shrinkage (DDPWS)(p-p)(no value)DataLaneLane1TestPatternPRBS9
Trial 1
Trial 1: Data Dependent Pulse Width Shrinkage (DDPWS)(p-p)

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Uncorrelated Jitter (UJ)(RMS) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the UJ of a host TX output.
Pass Limits:<= 23.0 mUIUncorrelated Jitter (UJ)(RMS)9.2 mUI
Result Details:
Result Details
Rising edge standard deviation880 fsFalling edge standard deviation910 fsDataLaneLane1TestPatternPRBS9
Trial 1
Trial 1: Rising edge standard deviation
Trial 1: Falling edge standard deviation

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Transmitter Waveform Dispersion Penalty for Cu (TWDPc) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 33
Test Summary: Pass Test Description: Verifies the WDP of a host TX output supporting passive direct attached cable.
Pass Limits:<= 10.700 dBeTransmitter Waveform Dispersion Penalty for Cu (TWDPc)9.313 dBe
Result Details:
Result Details
Estimated VMA547 mVDataLaneLane1TestPatternPRBS9

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Output AC Common Mode Voltage (rms) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 11
Test Summary: Pass Test Description: Verifies the Output AC Common Mode Voltage of a host TX output.
Pass Limits:<= 15.00 mVOutput AC Common Mode Voltage (rms)5.68 mV
Result Details:
Result Details
DataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Output AC Common Mode Voltage (rms)

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Single Ended Voltage Range (Positive) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 11
Test Summary: Pass Test Description: Verifies the Single Ended Voltage Range of a host TX output. This test is only available when using a differential signal.
Pass Limits:[-300 mV to 4.000 V]Single Ended Voltage Range (Positive)-161 mV
Result Details:
Result Details
VMax154 mVVMin-161 mVDataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Single Ended Voltage Range (Positive)

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Single Ended Voltage Range (Negative) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 11
Test Summary: Pass Test Description: Verifies the Single Ended Voltage Range of a host TX output. This test is only available when using a differential signal.
Pass Limits:[-300 mV to 4.000 V]Single Ended Voltage Range (Negative)-159 mV
Result Details:
Result Details
VMax155 mVVMin-159 mVDataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Single Ended Voltage Range (Negative)

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Total Jitter (TJ)(p-p) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the TJ of a host TX output. TJ is measured for a BER of 1E-12.
Pass Limits:<= 280.0 mUITotal Jitter (TJ)(p-p)212.8 mUI
Result Details:
Result Details
Total Jitter (TJ)(p-p)(no value)DataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Total Jitter (TJ)(p-p)

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Eye Mask Hit Ratio Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 12
Test Summary: Pass Test Description: Verifies the hit ratio of the eye mask of a host TX output. The ratio of the number of mask hits to the total sampling points must not exceed the compliance limit.
Pass Limits:<= 50.0 µEye Mask Hit Ratio0.0000000
Result Details:
Result Details
Number of UI2.964140 MUIDataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Eye Mask Hit Ratio

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Output AC Common Mode Voltage for Cu (rms) Reference: SFF-8431 Specifications for Enhanced Small Form Factor Pluggable Module SFP+, Revision 4.1, Table 33
Test Summary: Pass Test Description: Verifies the Output AC Common Mode Voltage of a host TX output supporting passive direct attached cables.
Pass Limits:<= 12.00 mVOutput AC Common Mode Voltage for Cu (rms)5.32 mV
Result Details:
Result Details
DataLaneLane1TestPatternPRBS31
Trial 1
Trial 1: Output AC Common Mode Voltage for Cu (rms)

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