Test Report

Overall Result: PASS

Test Configuration Details
Device Description
User Comments: 
5cm
10GTransFunc 
C:\Users\Public\Documents\Infiniium\Apps\USB3Test\TransferFunctions\N7015A_Deembed__TypC_TypC_14p1dbAt5GHz_Embed.tf4
5GTransFunc 
C:\Users\Public\Documents\Infiniium\Apps\USB3Test\TransferFunctions\U7242A_Deembed__USB3_TX_Device_Channel.tf4
AdcMode 
AUTO
DC Gain 
0
Reference Clock 
SSC
Device 
Device
Device ID: 
Device 1
Test Session Details
Infiniium SW Version 
06.10.00806
Infiniium Model Number 
DSOX92004A
Infiniium Serial Number 
MY54330103
Application SW Version 
3.20.0001
Debug Mode Used 
No
Compliance Limits (official) 
USB 3.1 Specification version 1.0
Last Test Date 
2018-03-08 13:25:00 UTC +08:00

Summary of Results

Test Statistics
Failed 0
Passed 22
Total 22

Margin Thresholds
Warning < 2 %
Critical < 0 %

Pass # Failed # Trials Test Name Actual Value Margin Pass Limits
0 1 5G LFPS Peak-Peak Differential Output Voltage 1.0435 V 39.1 % 800.0 mV <= VALUE <= 1.2000 V
0 1 5G LFPS Period (tPeriod) 57.9913 ns 47.5 % 20.0000 ns <= VALUE <= 100.0000 ns
0 1 5G LFPS Burst Width (tBurst) 1.1065 µs 36.7 % 600.0 ns <= VALUE <= 1.4000 µs
0 1 5G LFPS Repeat Time Interval (tRepeat) 10.0376 µs 49.5 % 6.0000 µs <= VALUE <= 14.0000 µs
0 1 5G LFPS Rise Time 297.7 ps 92.6 % VALUE <= 4.0000 ns
0 1 5G LFPS Fall Time 283.4 ps 92.9 % VALUE <= 4.0000 ns
0 1 5G LFPS Duty cycle 50.0408 % 49.8 % 40.0000 % <= VALUE <= 60.0000 %
0 1 5G LFPS AC Common Mode Voltage 32.4 mV 67.7 % VALUE <= 100.0 mV
0 1 5G TSSC-Freq-Dev-Min -5.054324 kppm 15.4 % -5.300000 kppm <= VALUE <= -3.700000 kppm
0 1 5G TSSC-Freq-Dev-Max 55.003 ppm 40.8 % TSSCMin ppm <= VALUE <= TSSCMax ppm
0 1 5G SSC Modulation Rate 30.583990 kHz 19.5 % 30.000000 kHz <= VALUE <= 33.000000 kHz
0 1 5G SSC Slew Rate 5.097 ms 49.0 % VALUE <= 10.000 ms
1 5G Short Channel Random Jitter 1.908 ps Information Only
0 1 5G Short Channel Maximum Deterministic Jitter 24.152 ps 71.9 % VALUE <= 86.000 ps
0 1 5G Short Channel Total Jitter at BER-12 50.992 ps 61.4 % VALUE <= 132.000 ps
0 1 5G Short Channel Template Test 0.000 100.0 % VALUE = 0.000
0 1 5G Short Channel Differential Output Voltage 332.6 mV 21.1 % 100.0 mV <= VALUE <= 1.2000 V
1 5G Random Jitter (CTLE ON) 1.819 ps Information Only
0 1 5G Far End Maximum Deterministic Jitter (CTLE ON) 31.383 ps 63.5 % VALUE <= 86.000 ps
0 1 5G Far End Total Jitter at BER-12 (CTLE ON) 56.974 ps 56.8 % VALUE <= 132.000 ps
0 1 5G Far End Template Test (CTLE ON) 0.000 100.0 % VALUE = 0.000
0 1 5G Far End Differential Output Voltage (CTLE ON) 109.7 mV 0.9 % 100.0 mV <= VALUE <= 1.2000 V


Report Detail


5G LFPS Peak-Peak Differential Output Voltage Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the peak-to-peak differential output voltage of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[800.0 mV to 1.2000 V]LPFS PeakToPeakVoltage1.0435 V
Result Details:
Result Details
Num Bursts Processed5

5G LFPS Period (tPeriod) Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the period of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[20.0000 ns to 100.0000 ns]tPeriod57.9913 ns
Result Details:
Result Details
Num Bursts Processed5

5G LFPS Burst Width (tBurst) Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-29
Test Summary: Pass Test Description: The purpose of this test is to verify that the burst width (tBurst) of the Polling.LFPS signal is within the conformance limits specified in Table 6-29 of the USB 3.1 Specification, version 1.0
Pass Limits:[600.0 ns to 1.4000 µs]tBurst1.1065 µs
Result Details:
Result Details
Num Bursts Processed5Burst Width Screen Capture(See image)
Trial 1
Trial 1: Burst Width Screen Capture

5G LFPS Repeat Time Interval (tRepeat) Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-29
Test Summary: Pass Test Description: The purpose of this test is to verify that the time interval when the next LFPS burst is transmitted (tRepeat) is within the conformance limits specified in Table 6-29 of the USB 3.1 Specification, version 1.0
Pass Limits:[6.0000 µs to 14.0000 µs]tRepeat10.0376 µs
Result Details:
Result Details
Num Bursts Processed5Repeat Interval Screen Capture(See image)
Trial 1
Trial 1: Repeat Interval Screen Capture

5G LFPS Rise Time Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the rise time of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:<= 4.0000 nsRise Time297.7 ps
Result Details:
Result Details
Num Bursts Processed5

5G LFPS Fall Time Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the fall time of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:<= 4.0000 nsFall Time283.4 ps
Result Details:
Result Details
Num Bursts Processed5

5G LFPS Duty cycle Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the duty cycle of the LFPS signal is within the conformance limits specified in Table 6-28 of the USB 3.1 Specification, version 1.0
Pass Limits:[40.0000 % to 60.0000 %]Duty cycle (%)50.0408 %
Result Details:
Result Details
Num Bursts Processed5

5G LFPS AC Common Mode Voltage Reference: USB 3.1 Specification, Rev 1.0, Section 6.9, Table 6-28
Test Summary: Pass Test Description: The purpose of this test is to verify that the maximum voltage from Txp + Txn for both time and amplitude is within the limits as specified in Table 6-28 of the USB 3.1 specification
Pass Limits:<= 100.0 mVAC Common Mode Voltage32.4 mV
Result Details:
Result Details


5G TSSC-Freq-Dev-Min Reference: USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC deviation is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification.
Pass Limits:[-5.300000 kppm to -3.700000 kppm]SSC Deviation (ppm)-5.054324 kppm
Result Details:
Result Details
Max UI (ppm)-4.985025 kppmMin UI (ppm)-5.054324 kppmSSC Profile(See image)
Trial 1
Trial 1: SSC Profile

5G TSSC-Freq-Dev-Max Reference: USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16 Refer to ECN 018 of USB3.0 specification if Radio Friendly SSC option is turned on.
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC deviation is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification. If Radio Friendly SSC option is turned on, this test will verify SSC deviation is within the conformance limits specified in ECN 018 of USB3.0 specification.
Pass Limits:[TSSCMin ppm to TSSCMax ppm]Worst SSC Deviation (ppm)55.003 ppm
Result Details:
Result Details
Max UI (ppm)55.003 ppmMin UI (ppm)10.000 ppmPassLimit Min (TSSCMin)-300.000 ppmPassLimit Max (TSSCMax)300.000 ppm

5G SSC Modulation Rate Reference: USB 3.1 Specification, Rev 1.0, Section 6.5.3, Table 6-16
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured SSC modulation rate is within the conformance limits specified in Table 6-16 of the USB 3.1 Specification.
Pass Limits:[30.000000 kHz to 33.000000 kHz]Modulation Rate (Hz)30.583990 kHz
Result Details:
Result Details
Modulation rate measurementSuccess

5G SSC Slew Rate Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.1, Table 6-17
Test Summary: Pass Test Description: The purpose of this test is to ensure the combination of SSC and all other jitter sources within the bandwidth of the CDR must not exceed the allowed slew rate as listed in Table 6-17.
Pass Limits:<= 10.000 msMax Slew Rate5.097 ms
Result Details:
Result Details
Slew Rate(See image)Min Phase-2.57 msMax Phase2.53 msTest PatternCP1
Trial 1
Trial 1: Slew Rate

5G Short Channel Random Jitter Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Info Test Description: The purpose of this test is to verify that the measured random jitter, Rj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:Info OnlyRJ1.908 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MRj_rms1.908 psRj_Total26.839 psTest PatternCP1Test Waveform(See image)
Trial 1
Trial 1: Test Waveform

5G Short Channel Maximum Deterministic Jitter Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured deterministic jitter, Dj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 86.000 psDJ24.152 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MDJ_dd24.152 psTest PatternCP0Test Waveform(See image)
Trial 1
Trial 1: Test Waveform

5G Short Channel Total Jitter at BER-12 Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured total jitter, Tj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 132.000 psTj at BER 10-1250.992 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MTj at BER 10-1250.992 psRj_rms(ps)1.908 psDJ_dd(ps)24.152 psRJ Test PatternCP1DJ Test PatternCP0TJ EquationTJ = DJ(CP0) + 14.069 * RJrms(CP1)

5G Short Channel Template Test Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to perform an eye mask test at TP1 using the eye mask template as specified in table 6-19 of the USB 3.1 specification.
Pass Limits:= 0.000Mask Test Failures0.000
Result Details:
Result Details
Total #UI Measured1.000000000 MNon-Transition Failures0.000Transition Failures0.000Non-Transition Eye Diagram(See image)Transition Eye Diagram(See image)Total Failures0.000CTLE Index1.000DFE Tap0.000NonTrans Max Voltage322 mNonTrans Min Voltage-321 mNonTrans Lower Margin Voltage-147 mNonTrans Upper Margin Voltage145 mNonTrans Eye Height392 mTrans Max Voltage333 mTrans Min Voltage-335 mTrans Lower Margin Voltage-116 mTrans Upper Margin Voltage116 mTrans Eye Height333 mMaximum Peak to Peak Jitter50 pMean Recover UI200.504Min Eye Width149.026Composit Eye Height333 mComposit Eye Location500 mMin Time Between CrossOver200 pTest PatternCP0Template FileC:\ProgramData\Keysight\Infiniium\Apps\USB3Test\SigTest5G\templates\usb_3_5gb\USB_3_5Gb_CP0_RjIN_SHORT.dat
Trial 1
Trial 1: Non-Transition Eye Diagram
Trial 1: Transition Eye Diagram

5G Short Channel Differential Output Voltage Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the differential output voltage measured at TP1 meets the minimum eye height as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:[100.0 mV to 1.2000 V]PeakToPeakVoltage332.6 mV
Result Details:
Result Details


5G Random Jitter (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Info Test Description: The purpose of this test is to verify that the measured random jitter, Rj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:Info OnlyRJ1.819 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MRj_rms1.819 psRj_Total25.591 psTest PatternCP1De-embed SettingsStd A to Std BEmbedded channel fileU7242A_Deembed__USB3_TX_Device_Channel.tf4

5G Far End Maximum Deterministic Jitter (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured deterministic jitter, Dj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 86.000 psDJ31.383 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MDJ_dd31.383 psTest PatternCP0De-embed SettingsStd A to Std BEmbedded channel fileU7242A_Deembed__USB3_TX_Device_Channel.tf4

5G Far End Total Jitter at BER-12 (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the measured total jitter, Tj measured at TP1 is within the limits as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:<= 132.000 psTj at BER 10-1256.974 ps
Result Details:
Result Details
Total #UI Measured1.000000000 MTj at BER 10-1256.974 psRj_rms(ps)1.819 psDJ_dd(ps)31.383 psRJ Test PatternCP1DJ Test PatternCP0TJ EquationTJ = DJ(CP0) + 14.069 * RJrms(CP1)

5G Far End Template Test (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to perform an eye mask test at TP1 using the eye mask template as specified in table 6-19 of the USB 3.1 specification.
Pass Limits:= 0.000Mask Test Failures0.000
Result Details:
Result Details
Total #UI Measured1.000000000 MNon-Transition Failures0.000Transition Failures0.000Non-Transition Eye Diagram(See image)Transition Eye Diagram(See image)Total Failures0.000CTLE Index1.000DFE Tap0.000NonTrans Max Voltage167 mNonTrans Min Voltage-167 mNonTrans Lower Margin Voltage-33 mNonTrans Upper Margin Voltage34 mNonTrans Eye Height167 mTrans Max Voltage167 mTrans Min Voltage-167 mTrans Lower Margin Voltage-5 mTrans Upper Margin Voltage4 mTrans Eye Height110 mMaximum Peak to Peak Jitter60 pMean Recover UI200.497Min Eye Width143.042Composit Eye Height110 mComposit Eye Location500 mMin Time Between CrossOver200 pTest PatternCP0Template FileC:\ProgramData\Keysight\Infiniium\Apps\USB3Test\SigTest5G\templates\usb_3_5gb\USB_3_5Gb_CP0_RjIN.datDe-embed SettingsStd A to Std BEmbedded channel file (5G)U7242A_Deembed__USB3_TX_Device_Channel.tf4
Trial 1
Trial 1: Non-Transition Eye Diagram
Trial 1: Transition Eye Diagram

5G Far End Differential Output Voltage (CTLE ON) Reference: USB 3.1 Specification, Rev 1.0, Section 6.7.3, Table 6-19
Test Summary: Pass Test Description: The purpose of this test is to verify that the differential output voltage measured at TP1 meets the minimum eye height as specified in Table 6-19 of the USB 3.1 specification.
Pass Limits:[100.0 mV to 1.2000 V]PeakToPeakVoltage109.7 mV