Result Details:

Result Details
#Avgs128Test PairBI_DA

Trial 1

Trial 1: Peak A, (Pair A)

1000 Base-T, Point B Peak Output Voltage(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2012 Subclause 40.6.1.2.1)

Test Summary: Pass Test Description: The magnitude of the voltage at Point B shall fall within the range of 0.67 V to 0.82V (0.75V +/- 0.83dB)
Pass Limits:(670.0 mV to 820.0 mV)Peak B706.8 mV

Result Details:

Result Details
#Avgs128Test PairBI_DA

Trial 1

Trial 1: Peak B, (Pair A)

1000 Base-T, Difference A,B Peak Output Voltage(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2012 Subclause 40.6.1.2.1)

Test Summary: Pass Test Description: The absolute value of the peak of the waveform at points A and B shall differ by less than 1%
Pass Limits:< 1.00 %% Difference870 m%

Result Details:

Result Details
Peak A Volts700.7 mVPeak B Volts-706.8 mV#Avgs128Test PairBI_DA

Next

1000 Base-T, Point C Peak Output Voltage(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2012 Subclause 40.6.1.2.1)

Test Summary: Pass Test Description: The absolute value of the peak of the waveform at point C shall differ by less than 2 0.000000rom 0.5 times the average of the absolute values of the peaks of the waveform at points A and B
Pass Limits:< 2.00 %% Difference1.01 %

Result Details:

Result Details
Peak A Volts700.7 mVPeak B Volts-706.8 mVPeak C348.4 mV#Avgs128Test PairBI_DA

Trial 1

Trial 1: Peak C, (Pair A)

1000 Base-T, Point D Peak Output Voltage(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.1)

Test Summary: Pass Test Description: The absolute value of the peak of the waveform at point D shall differ by less than 2 0.000000rom 0.5 times the average of the absolute values of the peaks of the waveform at points A and B
Pass Limits:< 2.00 %% Difference300 m%

Result Details:

Result Details
Peak A Volts700.7 mVPeak B Volts-706.8 mVPeak D-350.8 mV#Avgs128Test PairBI_DA

Trial 1

Trial 1: Peak D, (Pair A)

1000 Base-T, Point A Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points A, B, C, D defined in Figure 40-19 (after normalization) shall lie within the time domain template 1 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-10. The waveform around point A is normalized by dividing by the peak value of the waveform at A.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point A -- Failure DetailsNo FailureTemplate Point A(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point A -- No Failures

1000 Base-T, Point B Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points A, B, C, D defined in Figure 40-19 (after normalization) shall lie within the time domain template 1 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-10. The waveform around point B is normalized by dividing by the negative of the peak value of the waveform at A.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point B -- Failure DetailsNo FailureTemplate Point B(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point B -- No Failures

1000 Base-T, Point C Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points A, B, C, D defined in Figure 40-19 (after normalization) shall lie within the time domain template 1 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-10. The waveform around point C is normalized by dividing by the 1/2 the peak value of the waveform at A.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point C -- Failure DetailsNo FailureTemplate Point C(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point C -- No Failures

1000 Base-T, Point D Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points A, B, C, D defined in Figure 40-19 (after normalization) shall lie within the time domain template 1 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-10. The waveform around point D is normalized by dividing by the negative of 1/2 the peak value of the waveform at A.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point D -- Failure DetailsNo FailureTemplate Point D(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point D -- No Failures

1000 Base-T, Point F Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points F and H defined in Figure 40-19, (after normalization) shall lie within the time domain template 2 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-11. The waveform around point F is normalized by dividing by the peak value of the waveform at F.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point F -- Failure DetailsNo FailureTemplate Point F(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point F -- No Failures

1000 Base-T, Point H Template Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.3)

Test Summary: Pass Test Description: Fit The Template. The voltage waveforms around points F and H defined in Figure 40-19, (after normalization) shall lie within the time domain template 2 defined in Figure 40-26 and the piecewise linear interpolation between the points in Table 40-11. The waveform around point H is normalized by dividing by the peak value of the waveform at H.
Pass Limits:No Mask FailuresTotal # Failures0.000

Result Details:

Result Details
Template Point H -- Failure DetailsNo FailureTemplate Point H(no value)#Avgs128# Waveforms50Test PairBI_DA

Trial 1

Trial 1: Template Point H -- No Failures

1000 Base-T, Point G Droop Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.2)

Test Summary: Pass Test Description: The Voltage at Point G (500ns after point F) must be more than 73.1% of the negative Voltage at Peak F
Pass Limits:> 73.10 %% of G95.52 %

Result Details:

Result Details
V at F-1.09606 VV at G-1.04701 V#Avgs128Test PairBI_DA

Trial 1

Trial 1: Droop at G, (Pair A)

1000 Base-T, Point J Droop Test(w/o Disturbing Signal) Reference: IEEE Std. 802.3ae (IEEE802.3-2008 Subclause 40.6.1.2.2)

Test Summary: Pass Test Description: The Voltage at Point J (500ns after point H) must be more than 73.1% of the Voltage at Peak H
Pass Limits:> 73.10 %% of J95.26 %

Result Details:

Result Details
V at H1.0335 VV at J984.6 mV#Avgs128Test PairBI_DA

Trial 1

Trial 1: Droop at J, (Pair A)

Test Configuration Details
Device Description
ReturnLossTest	Use Vector Network Analyzer
DisturberSource	Use Keysight 33250A
Test Session Details
Infiniium SW Version	06.10.01001
Infiniium Model Number	DSOS254A
Infiniium Serial Number	MY57500112
Application SW Version	2.50
Debug Mode Used	No
Compliance Limits (official)	IEEE Std. 802.3ae Specification
Probe (Channel 1)	Model: User Defined Probe Serial: No Serial Num Atten: Calibrated (21 JUN 2019 13:49:17), Using Cal Atten (1.0063E+00) Skew: Calibrated (21 JUN 2019 13:49:06), Using Cal Skew
Probe (Channel 2)	Model: 1134A Serial: US55011124 Head: E2678A/B Atten: Calibrated (24 JUN 2019 09:33:06), Using Cal Atten (9.9646E+00) Skew: Calibrated (24 JUN 2019 09:32:53), Using Cal Skew
Probe (Channel 3)	Model: User Defined Probe Serial: No Serial Num Atten: Calibrated (21 JUN 2019 13:49:55), Using Cal Atten (1.0053E+00) Skew: Calibrated (21 JUN 2019 13:49:47), Using Cal Skew
Probe (Channel 4)	Model: 1131A Serial: US49410311 Head: E2678A/B Atten: Calibrated (24 JUN 2019 09:47:31), Using Cal Atten (1.0018E+01) Skew: Calibrated (24 JUN 2019 09:47:19), Using Cal Skew
Last Test Date	2019-06-24 09:56:32 UTC +08:00

Test Statistics
Failed	0
Passed	13
Total	13

Margin Thresholds
Warning	< 2 %
Critical	< 0 %

Summary of Results

Report Detail

Pass	# Failed	# Trials	Test Name	Actual Value	Margin	Pass Limits
	0	1	1000 Base-T, Point A Peak Output Voltage(w/o Disturbing Signal)	700.7 mV	20.5 %	670.0 mV < VALUE < 820.0 mV
	0	1	1000 Base-T, Point B Peak Output Voltage(w/o Disturbing Signal)	706.8 mV	24.5 %	670.0 mV < VALUE < 820.0 mV
	0	1	1000 Base-T, Difference A,B Peak Output Voltage(w/o Disturbing Signal)	870 m%	13.0 %	VALUE < 1.00 %
	0	1	1000 Base-T, Point C Peak Output Voltage(w/o Disturbing Signal)	1.01 %	49.5 %	\|VALUE\| < 2.00 %
	0	1	1000 Base-T, Point D Peak Output Voltage(w/o Disturbing Signal)	300 m%	85.0 %	\|VALUE\| < 2.00 %
	0	1	1000 Base-T, Point A Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point B Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point C Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point D Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point F Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point H Template Test(w/o Disturbing Signal)	0.000	100.0 %	No Mask Failures
	0	1	1000 Base-T, Point G Droop Test(w/o Disturbing Signal)	95.52 %	30.7 %	VALUE > 73.10 %
	0	1	1000 Base-T, Point J Droop Test(w/o Disturbing Signal)	95.26 %	30.3 %	VALUE > 73.10 %