Calibration Start
Calibration: Ticks per ms is 999297
Calibration Completed

-----------------------------------------------------------
Test Details for test ID      = 13 
Test Profile[13]: Description = Default Unit Test (Max speed)
Test Profile[13]: PowerCyle   = Required
Test Profile[13] Device Config : Mode        = SOC Default
Test Profile[13] Device Config : BusVoltage  = SOC Default
Test Profile[13] Device Config : BusWidth    = SOC Default
Test Profile[13] Device Config : Interrupt   = SOC Default
------------------------------------------------------------
DMA is enabled 
Interrupts are disabled 


Performing RAW mode read/write tests ..


MMCSD_Open() completed successfully
Getting SD Card parameters
SD Card: BlockSize = 512,  BlockCount = 0x01dacc00, CardSize = 0x3b5980000 bytes

RAW READ/WRITE: Writing test pattern (256 KB) to the SD card starting at sector 0x300000 in 1 block(s) 256 KB each 
RAW READ/WRITE: Reading test pattern (256 KB) from the SD card starting at sector 0x300000 in 1 block(s) 256 KB each 
RAW READ/WRITE: PASS: Read/Write Success for this size (256 KB)

RAW READ/WRITE: Writing test pattern (512 KB) to the SD card starting at sector 0x300000 in 1 block(s) 512 KB each 
RAW READ/WRITE: Reading test pattern (512 KB) from the SD card starting at sector 0x300000 in 1 block(s) 512 KB each 
RAW READ/WRITE: PASS: Read/Write Success for this size (512 KB)

RAW READ/WRITE: Writing test pattern (1024 KB) to the SD card starting at sector 0x300000 in 1 block(s) 1024 KB each 
RAW READ/WRITE: Reading test pattern (1024 KB) from the SD card starting at sector 0x300000 in 1 block(s) 1024 KB each 
RAW READ/WRITE: PASS: Read/Write Success for this size (1024 KB)

RAW READ/WRITE: Writing test pattern (2048 KB) to the SD card starting at sector 0x300000 in 1 block(s) 2048 KB each 
RAW READ/WRITE: Reading test pattern (2048 KB) from the SD card starting at sector 0x300000 in 1 block(s) 2048 KB each 
RAW READ/WRITE: PASS: Read/Write Success for this size (2048 KB)

RAW READ/WRITE: Writing test pattern (5120 KB) to the SD card starting at sector 0x300000 in 1 block(s) 5120 KB each 
RAW READ/WRITE: Reading test pattern (5120 KB) from the SD card starting at sector 0x300000 in 1 block(s) 5120 KB each 
RAW READ/WRITE: PASS: Read/Write Success for this size (5120 KB)

RAW READ/WRITE : Closing the driver..
-------- Benchmarks for the below profile -----------
-----------------------------------------------------------
Test Details for test ID      = 13 
Test Profile[13]: Description = Default Unit Test (Max speed)
Test Profile[13]: PowerCyle   = Required
Test Profile[13] Device Config : Mode        = SOC Default
Test Profile[13] Device Config : BusVoltage  = SOC Default
Test Profile[13] Device Config : BusWidth    = SOC Default
Test Profile[13] Device Config : Interrupt   = SOC Default
------------------------------------------------------------

 ----- RAW Read/Write Throughput measurements -------
Throughput is measured by reading/writing a contiguous block of memory of varying sizes using MMCSD_Write/Read() APIs 

---------------------------------------
| Size(KB) | Write(MB/s) | Read(MB/s) |
---------------------------------------
|     256  |  12.0629   |   9.2898   |
|     512  |  13.4195   |   10.9889   |
|    1024  |  12.6914   |   11.0714   |
|    2048  |  9.9715   |   11.0823   |
|    5120  |  12.9406   |   11.0933   |
---------------------------------------

Test PASSED for this test configuration
Test Complete for this profile 


--------- PLEASE NOTE  ---------- 

 This test required powercycle. 
 Before running the next test, either Powercycle and run other test  OR  Pop the SD Card out & back in 

All tests have PASSED
1/1 tests passed