øCalibration Start
Calibration: Ticks per ms is 999131
Calibration Completed

-----------------------------------------------------------
Test Details for test ID      = 13
Test Profile[13]: Description = Default Unit Test (Max speed)
Test Profile[13]: PowerCyle   = Required
Test Profile[13] Device Config : Mode        = SOC Default
Test Profile[13] Device Config : BusVoltage  = SOC Default
Test Profile[13] Device Config : BusWidth    = SOC Default
Test Profile[13] Device Config : Interrupt   = SOC Default
------------------------------------------------------------

Board MMC Voltage Switch Function present
DMA is enabled
Interrupts are disabled


Performing RAW mode read/write tests ..

Getting SD Card parameters
SD Card: BlockSize = 512,  BlockCount = 0x01dacc00, CardSize = 0x3b5980000 bytes

RAW READ/WRITE: Writing test pattern (256 KB) to the SD card starting at sector 0x300000 in 1 block(s) 256 KB each
RAW READ/WRITE: Reading test pattern (256 KB) from the SD card starting at sector 0x300000 in 1 block(s) 256 KB each
RAW READ/WRITE: PASS: Read/Write Success for this size (256 KB)

RAW READ/WRITE: Writing test pattern (512 KB) to the SD card starting at sector 0x300000 in 1 block(s) 512 KB each
RAW READ/WRITE: Reading test pattern (512 KB) from the SD card starting at sector 0x300000 in 1 block(s) 512 KB each
RAW READ/WRITE: PASS: Read/Write Success for this size (512 KB)

RAW READ/WRITE: Writing test pattern (1024 KB) to the SD card starting at sector 0x300000 in 1 block(s) 1024 KB each
RAW READ/WRITE: Reading test pattern (1024 KB) from the SD card starting at sector 0x300000 in 1 block(s) 1024 KB each
RAW READ/WRITE: PASS: Read/Write Success for this size (1024 KB)

RAW READ/WRITE: Writing test pattern (2048 KB) to the SD card starting at sector 0x300000 in 1 block(s) 2048 KB each
RAW READ/WRITE: Reading test pattern (2048 KB) from the SD card starting at sector 0x300000 in 1 block(s) 2048 KB each
RAW READ/WRITE: PASS: Read/Write Success for this size (2048 KB)

RAW READ/WRITE : Closing the driver..

 ----- RAW Read/Write Throughput measurements -------
Throughput is measured by reading/writing a contiguous block of memory of varying sizes using MMCSD_Write/Read() APIs

---------------------------------------
| Size(KB) | Write(MB/s) | Read(MB/s) |
---------------------------------------
|     256  |  17.4486   |   19.7251   |
|     512  |  18.7918   |   21.8591   |
|    1024  |  19.3558   |   21.9868   |
|    2048  |  20.5346   |   22.0564   |
---------------------------------------

Test PASSED for this test configuration
Test Complete for this profile


--------- PLEASE NOTE  ----------

 This test required powercycle.
 Before running the next test, either Powercycle and run other test  OR  Pop the SD Card out & back in

All tests have PASSED
1/1 tests passed