Part Number: LM117HVQML-SP We are currently using the 5962R0722902VZA device. Is there any ELDRS related radation test data available? I did see that there is now a 5962R0722962VZA device with ELDRS data. Are these two devices physically the same part…
Part Number: LM117HVQML-SP Other Parts Discussed in Thread: LM117 Hi all, I came across an old applications note 181 from National Semiconductor with details on the LM117 that go into more detail that the datasheet. I was wondering if TI had more information…
Part Number: LM117HVQML-SP Other Parts Discussed in Thread: LM117 , We are able to find Total Ionizing Dose (TID) and Total Non-Ionizing Dose (TNID) test reports on the TI web site, but nothing on the Single Event Effect (SEE) characteristics. A National…
Part Number: LM117HVQML-SP Hello,
In our application, we use this component as a voltage regulator. It transforms the 8.5V into 5V.
During the analysis, our customer pointed out the fact that if an hypotetical issue happened with this compoenent,…
Part Number: LM117HVQML-SP Tool/software: Hi,
I am using the LM117HVQML-SP in a system that can see input voltage transients of up to 75V. Can the LM117HVQML-SP take transients of this high, say if the transient is 75V, 20V/us, and 10us total pulse…
Part Number: LM117HVQML-SP Tool/software: Hi team
I am following the post below. Are there SEE data in the 3rd party?
https://e2e.ti.com/support/power-management-group/power-management/f/power-management-forum/1242975/lm117hvqml-sp-see-data?tisearch…
Part Number: LM117HVQML-SP Tool/software: Disclaimer: Mechanical engineer trying to analyze electrical board.
Looking for guidance on thermal analysis for this chip. Is the R_thetaJC taking into account the leads or are the leads in addition?
For…
Part Number: LM117HVQML-SP Tool/software: We are using the 16 CFP (NAC) package for the LM117HVNAC/EM. I plan to open the solder mask under the body to provide a path for thermal relief.
Is this part designed to have the bottom side of the body soldered…
