Part Number: TPS7H3301-SP To Whom It May Concern,
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P/N:TPS7H3301HKR/EM
Discoloration of the lead.
We do fully understand MIL-STD-883, TM2009 will not be applicable to this part since this…
Part Number: TPS7H3301-SP Hi,
Is 5962-1422801VXC tested under radiation environment?
If not, could you let me know the test or screening difference between 5962-1422801VXC and 5962R1422801VXC?
Thanks.
Part Number: TPS7H3301-SP Hello, I was wondering if this regulator can tolerate reverse currents/voltages and if it can begin regulating in a prebias output situation, even if the voltage at the input is adequate.
we are concerned that the power sourcing…
Part Number: TPS7H3301-SP Hi,
In section 8.2.2.4, the following appears: "Consider adding a low-pass R-C filter at the VTTSNS pin in case the ESR of the VTT output capacitor or capacitors is larger than 2m ohm. The R-C filter time constant should…
Part Number: TPS7H3301-SP Hi, customer is using 5962-1422801VXC. They would like to know the lead finish: gold plating THICKNESS. Where is this documented? Else, please provide the thickness value. Thanks in advance.
Part Number: TPS7H3301-SP Hi, I have a couple of questions related to the stability of this IC. I will start with EVM and then will proceed to my design. 1) in the EVM I found out a contradiction that I don't get. RC=Cout*ESR. when you solve this equation…
Part Number: TPS7H3301-SP
Component datasheet calls out a low level input enable voltage (Venil) maximum value of 0.3Vdc and a enable hysteresis nominal value of 0.5Vdc. How should we interpret how the 0.5Vdc hysteresis works in relation to the enable…
Part Number: TPS7H3301-SP Hello,
While performing WCA, I've noticed that VENILmax is quite low at 0.3V over full temperature. I assume that VENILmax could be increased if not used over the full temperature range. My application junction temperature…
Part Number: TPS7H3301-SP Hello,
I see in the datasheet that VVTTREF tolerance is specified at +/-15mV over the full temperature range of -55C to +125C. I am performing worst case analysis for a DDR2 application and am marginally failing due to variance…