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LM393: Regarding Device Aging and Performance...

Part Number: LM393
Other Parts Discussed in Thread: TLV431

Research group I'm working with is interested in looking into the aging effect on devices like LM393 and TLV431BCD.

Do we have any material (particularly graphs) showing the affect on aging on the following parameters, for example? (Other parameters data would be great if available....)

- Offset Voltage vs Aging
- Bias Currents vs Aging

- Shunt Voltage vs Aging

  • Hello Darren,

    We are not aware of any long-term aging studies on the LM393 or it's sister devices.

    We don’t think either offset voltage or bias current on the LM393 would have any impact on aging unless you were exceeding the abs max input voltages or otherwise stressing the device.

    The currents in these devices are in the micro and nanoamps range, so there is little stress on the beefy geometries dating back to the 1970's.. So any drift would be well within the datasheet specifications, since the LM393 was never really considered a "precision" device.

    The TLV431 question should be asked in the low power forum - as I cannot comment if any studies were done on that device.

  • Hi Paul,

    I think there is a little confusion. I was wondering what the affect of aging had on device parameters (doesn't need to be just offset/bias).

    For example, a device run under xx conditions for xx time, exhibits a trend where [insert electrical characteristic here] value decreases over time, or maybe it increases over time.

    Could you just double check and see if this kind of information is out there somewhere? Maybe have to follow-up offline?

    I'll ask in another forum for TLV431, sorry about that.


  • Hello Darren,

    Each device is unique and will have different effects due to layout, current densities, and even package stress. This is a question for the designers and process engineers.

    I did not find any post-production studies on long term drift. That subject may be interesting to the precision amp and reference groups, but not for the commodity LM393 comparator - I doubt if anyone has done one..

    The only applicable "studies" I can think of would be the accelerated HTOL (High Temperature Operating Life) testing that is done as part of the product release process.

    These tests are performed for 300 to 2000 hour periods, at 125C at full bias to "age" the device, with tests run at certain time intervals looking for shifts. So the HTOL results may give some clues. This data is company confidential and cannot be publicly shared - so anything along these lines needs to be taken off-line.

    Are you asking this question on all devices in general, or just the LM393 in particular? We should probably know what parameters are of most interest.

    I'll close this thread and contact you internally put you in tough with a few applicable people that may be able to answer some of your questions.

  • Hi Darren,

    maybe this here is of interest Relaxed


  • Hi Kai,

    Thanks for the pointer. I did not know it was out there...

    I put Darren directly in touch with Marek internally, and he gave him a copy of the presentation and answered his questions.

    Thanks again!

  • Hi guys, 

    Yes, that material was really helpful.

    Marking "This resolved my issue" to close the thread.