Other Parts Discussed in Thread: TLV431
Research group I'm working with is interested in looking into the aging effect on devices like LM393 and TLV431BCD.
Do we have any material (particularly graphs) showing the affect on aging on the following parameters, for example? (Other parameters data would be great if available....)
- Offset Voltage vs Aging
- Bias Currents vs Aging
- Shunt Voltage vs Aging