TLE2426: different level of scratches and copper exposure was found on all samplings of TLE2426IDR

Hi Heidi,

These are testing markings from the IC's screening process, where each IC is gone through a defined testing sequences. If the ICs are evaluated and met the screened datasheet specification, then there parts are packaged at the end of ATE production line. These markings are normal and do not affect the functionality of the parts.

Please give me a couple days and I will see if we have a standard or the cosmetics appearance of the delivered products. The middle image is magnified by 6X-8X and so it will look "scratched" from the image. I will see if we have a standard quality control about these markings. If so, how these markings are defined as the acceptable "scratches" of the deliverable goods. . 

Best,

Raymond 

Hi Heidi, 

I have received the reply back from our manufacturing Quality engineer - The "scratched" markings are generated from ATE testing process(Different socket pin will generate different scratch mark). From below snapshot view point, that’s belong typically mark and within Spec(QSS-005-105).

QSS-005-105 V/M Quality of Finished Product (Dual Inline Lead Surface Mount Packages)

https://giant.sc.ti.com/SCQS/qssrep.nsf/active/005-105.pdf/$File/005-105.pdf?OpenElement

My comments. Copper based alloy leads are scratch-prone metal conductor. If the product has solderability issues, we can contact the quality engineers.  

If you have further questions, please let me know. 

Best,

Raymond 

Hi Heidi, 

The information is not public, which I did not realize that. 

I will send a "friendship" invite to you via E2E private messaging system. I will send you the document once we established the contact. 

Best,

Raymond