Other Parts Discussed in Thread: LM111
Tool/software:
Hi TI team,
We have been conducting offset voltage test for the LM111JG comparator using the Single Auxiliary op amp servo loop method in a bench setup. The testing is performed at ambient temperature. We have observed an irregularity during this bench testing, which is listed below:
- We have taken three sample LM111JG devices to perform the offset voltage test. The servo loop circuit used for this testing is attached below as Circuit 1. Here we force a voltage at the auxiliary op-amp's non-inverting terminal 1 V, which we refer to as the target voltage in the test. When measuring the offset voltage at VOS out (Servo out), we observed that the VOS voltage changes at different times. Although the measured values fall within the datasheet limits, the offset voltage is expected to remain at a certain level with only minor variations. In our case, we are observing differences ranging from 200 mV to 1 V when measured at different times. The observed differences are tabulated below for reference. Refer table 1.
We have double-checked the circuit and didn’t find any issues. Please help us to understand if this behavior is due to the nature of the device or the target voltage, we are providing is wrong because of that this deviation is happening - If so please explain us the solution for this and tell how the target voltage that need to be forced is determined.
Note: We couldn't find LM111QML, so we are using LM111JG for the bench testing. If you provide a solution with respect to LM111QML also that will be helpful.
Table 1:
|
VOS_OUT data comparison |
||
|
Device |
Attempt 1 |
Attempt 2 |
|
DUT_1 |
-860mV |
-100.2mV |
|
DUT_2 |
-2.476V |
-1.814V |
|
DUT_3 |
-3.817V |
-2.906V |
|
DUT_4 |
-2.004V |
-1.423V |

