LF353: The Pin1&7 output of defective products is low

Kevin,

These devices are in a somewhat complex configuration.  I assume the output voltages that you provide relate to your expected output.  When we consider a device to be good or bad we make this determination based on if the device meets the data sheet requirements.  Do you have an idea as to what specification you think the op amp is not meeting?  Can you perform an A-B-A test between good and bad devices (below is the definition of an A-B-A swap test).  It is possible that the devices that you call NG do have a problem, but it is also possible that they are just different from older generation devices and still meet the data sheet requirements.  If you have insight as to what data sheet specification the devices is not meeting that would be very helpful in the debug process.

ABA Test:  Overview: • A-B-A Swap is a verification technique that is crucial during the application troubleshooting process. • Provides confirmation that non-conforming behavior follows the Device Under Test (DUT) • Completion of an A-B-A swap is required prior to returning a DUT to TI devices for analysis.

Best regards, Art