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INA202: Trips during regulatory tests

Part Number: INA202

During immunity RF-radiation tests the INA202 circuits trips. We are interested in getting some tips about how to manage that.

Schematics and more information can be sent, but we prefer to discuss this with TI privately.

Best regards

Mats Arnlund

Hectronic AB

  • Hello Mats,

    Thanks for using the forum.  Before we go into details of the schematic lets try figure it out without sharing the schematic.  A few questions.  Are you able to able to measure Vout, or Vin(both input of Current sense amplifier and Comparator).,  The reason is to narrow down the source of dc-offset caused by the RF.  The RF can cause unknown rectifier conditions that cause a DC offset.  It does not always have to be the input but normally that is the point that will get gained up and cause dc issues. 

  • Working offline with shared schematics.  Will post any resolution that can be shared.