This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

LMP8480: the IC always destroyed when we do the hot swap test ,

Part Number: LMP8480

in our design circuit ,we use the LMP8480 to sense high side current ,but the IC always destroyed when we do the hot swap test ,I don't know ,please help me how to solve this issue. thanks very much .

  • Hello User,

    I need a little more information to attempt to help.  Is there anyway during your test you exceed absolute max rating in the datasheet?  If so then this will cause issues and .  What exactly are your conditions on the LMP8480 and how do you run the test?  How is the LMP8480 destroyed?  Is it the output, the input, or the supply pins that have issues after your event.

  • Hello User,

    It's been a week since your post, so I hope your issue has been resolved. If you still need help, please reply with answers to Javier's questions so he can continue to assist you.

    Best regards,

    Ian Williams
    Applications Manager
    Current Sensing