I would like to ask if anyone has a reliability or performance for radiation exposure of the INA201-Q1 device. I am assuming it should have a decent minimum total ionisation dose (TID) > 5-10kRads but I need to collect some data if exists in the hands of Texas Instruments. It would also be great if I can have the available reliability data of INA201-Q1, and the CMOS process technology. Maybe I can infer something from them.
Thanks in advance,