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OPA2314-Q1: Electrical characteristics life test data or aging data

Paul11
Prodigy 230 points
Part Number: OPA2314-Q1

Does anyone know where to find any electrical characteristics life test data or aging data for the OPA2314-Q1?

  • 0
    TI__Guru 60400 points

    Paul,
    Please find the OPA2314-Q1 Early Life Failure Rate (ELFR) and Mean Time Between Failures (MTBF) data under link below:
    www.ti.com/.../estimator.tsp

  • 0 in reply to Marek Lis
    Prodigy 230 points
    Thank you but this is not quite what I'm looking for.

    I'm interested in know how much the electrical characteristics (e.g. input bias current, input offset current, input offset voltage, quiescent supply current, gain-bandwidth product, and voltage output swing from supply rails) change throughout the device's life. This might be in any life test data or aging data.
  • 0 in reply to Paul11
    TI__Guru 60400 points

    Paul,

    We do not share actual life test data with customers but provide general information on the criteria used in our qualification process.  One of such criteria uses deltas (shifts) of various specs to qualify the product. Thus, in order to pass the life test, all specs centered around zero like Vos, drift, AOL, CMRR, PSRR are 'allowed' to shift by up to +/-100% of the max datasheet limit while specs centered around an absolute value like IQ, slew rate, short-circuit current, etc. are 'allowed' to shift by up to +/-10% of the max datasheet limit.  However, you must understand that the actual parametric shifts might be much smaller, and often are, than the allowable shift limits used in our qualification process. For more details, please review the presentation I have attached within this forum post.

     

    6201.Long-Term Stability.ppt

  • 0 in reply to Marek Lis
    Prodigy 230 points
    Thank you for this reply. It is very helpful.