Hi,
Our Radiation SEE tests show that the OCR register is susceptiple to SEUs (bit flips).
Our design does not use this feature, we do not use:
8.4.1.2 Offset Calibration During Normal Operation
Part of the problem for us is detection of OCR register bit upsets, as it is not possible to
read this register.
We would like to deteremine the full impact of this register on the ADC converted data,
would it be possible for you to imform us how many bits are in this register and the
maximum offset that can be applied to the converted data (positive or negative) ?
Many thanks,
Gerry