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ADS1282-SP: ADS1282-SP - Single Event Latchup (SEL) at 85°C

Part Number: ADS1282-SP

Dear All,

it's stated that "Single Event Latchup (SEL) Immune to LET = 60 MeV-cm2/mg at 85°C", but in the Report SBAA222 I cannot find any evidence about the relevant test data with this LET.

The max LET in Table8 is 50.5 MeV·cm2 /mg, I don't understand where the 60.4 MeV·cm2 /mg is coming from.

Do you have a more complete report with Test Data at 60.4 MeV·cm2 /mg?

Otherwise, with the data available in the above mentioned Report, the SEL immunity seems to be 50.5 MeV·cm2/mg at 125°C and also at 85°C.

Is this the proper statement?

There are major changes from 50.5 MeV·cm2/mg to 60.4 MeV·cm2 /mg.

With no additional test data for a LET = 60.4 MeV·cm2 /mg at 85°C, it's not possible to consider this SEL immunity for our project.

Many Thanks and Best Regards,

Emiliano Bruschini

Sitael S.p.A.

  • Hello Emiliano,

    I think I understand the question. You want to understand why Table 8 doesn't have 60.4  MeV·cm2 /mg though it is explicitly and unceremoniously stated in the overview (and test results) section:

    In other words, you're looking for any other data points regarding 60.4 MeV·cm2 /mg and confirmation that LET = 60.4 MeV·cm2 /mg at 85°C resulted in no latch up. Is that correct? 

    I'll have to talk with the team, there might be a couple of days delay before we can get confirmation.

    Best,

    -Cole

  • Hello Cole,

    yes, we are aligned, I'm looking for the test data concerning 60.4 MeV cm2/mg, if possible in a tabular form as per Table 8:

    - Run;

    - Serial Number (the number of tested samples at this LET is very major);

    - Ion + Angle of incidence;

    - Effective LET;

    - Effective Fluence;

    - Temp;

    - Result.

    It's a fully MIL qualified part, we would like to propose this component for an ESA Class 1 project but the conclusions are not enough, we need the basic raw data to be presented to ESA.

    BR,

    Emiliano

  • Hey Emiliano,

    Perfect, thanks for the reply.

    Small update, some people are out of office right now (this usually happens around July 4th week) so I'm slowly getting in contact with others that can help. I'll let you know when I get an update.

    Best,

    -Cole

  • Hello Cole,

    ok, no problems, I wait for you.

    BR,

    Emiliano

  • Hello Cole,

    I have discussed the Report SBAA222 with our customer, I confirm that a more detailed Report is required in order to clarify the declared SEL immunity at 85°C (LET = 60.4 MeV-cm2/mg).

    Furthermore, our customer has the following additional questions:

    - Can you confirm that effective LET in Table 6 is the LET at the surface of the sensitive elements of the IC (FEOL)?

    - Have you used only Ag in tilted configuration for SEL verification? No other Ions in normal incidence (at 0°)?

    - Can you confirm that the tested wafer / difussion lot (into the tested DC 1530) is the same used in the currently manufactured devices?

    - Can you confirm that you don't have performed a proton testing on this part type?

    I'm fully available to start an email exchange with the expert at TI, if possible.

    MT and BR,

    Emiliano

  • Hello Cole,

    in brief, is it possible to receive the Report  [6. Inc, Aeroflex RAD, "SEE Test Report for Texas Instruments ADS1282-SP high resolution analog-todigital converter (ADC)," Aeroflex RAD Inc, Colorado Springs, CO, 1025] mentioned in SBAA222?

    I think it could be very useful and it could reply to most (maybe all ) of our questions.

    Please let me know, Antonio Faggio (Staff Field Application Engineer Italy) is well informed and could support.

    Many thanks,

    Emiliano

  • Hi Emiliano,

    Agreed, we've been talking with Antonio internally. He's been helpful in communicating with what you all need. 

    Unfortunately, we're still working on it. To make sure we don't split communication channels, we'll either contact Antonio; or we'll contact you directly via email, as you suggested, and be sure to loop Antonio. We'll definitely keep you updated once we get an answer.

    Thank you,

    -Cole

  • Hello Cole,

    ok, we need an answer within this week, because we have to decide which ADC to use, so we can finalize our design.

    I wait for you.

    BR,

    Emiliano

  • Hello Emiliano,

    I heard Antonio is traveling at the moment so you may or may not have already seen this. 

    But we're planning on updating SBAA222 with the rest of the table:

    I think Antonio might have referenced another paper with you already as well? I don't think it is [6. Inc, Aeroflex RAD, "SEE Test Report for Texas Instruments ADS1282-SP high resolution analog-to-digital converter (ADC)," Aeroflex RAD Inc, Colorado Springs, CO, 1025] but it was related to SBAA222.

    Between the paper and the questions, we're still working and we still plan to keep you updated using other channels. Because this will be formatted to the table and become public information eventually, I thought I'd drop it here as a reference.

    Let me know if there's any updates.

    Best,

    -Cole

  • Hello Cole,

    many thanks for additional data about LET = 60.4 MeV·cm2 /mg at 85°C and good to know that SBAA222 is going to be updated.

    If I cannot receive the complete report [6. Inc, Aeroflex RAD, "SEE Test Report for Texas Instruments ADS1282-SP high resolution analog-to-digital converter (ADC)," Aeroflex RAD Inc, Colorado Springs, CO, 1025], how can I clarify the detailed comments of our customer? Can I have a direct contact at TI for this scope?

    We will have a formal Radiation Control Board with ESA and a lot of questions will be issued, I need to know how to manage them.

    I wait for your updates, you can use the channel you prefer.

    BR,

    Emiliano 

  • Hi Emiliano,

    I've decided to respond here for the questions:

    - Can you confirm that effective LET in Table 6 is the LET at the surface of the sensitive elements of the IC (FEOL)?

    • Yes this is the LETeff at the surface elements of the IC.

    - Have you used only Ag in tilted configuration for SEL verification? No other Ions in normal incidence (at 0°)?

    • All the testing based on the report we have indicates that we used Ag ion and to reach higher surface LET’s the device is tested with an angle at the cyclotron facility.
      • LETeff = LET(incident)/CosƟ

    - Can you confirm that the tested wafer / difussion lot (into the tested DC 1530) is the same used in the currently manufactured devices?

    • Yes;  based on the ATSS flow same die is used 

    - Can you confirm that you don't have performed a proton testing on this part type?

    • We did not perform any proton testing.

    It looks like there's not a good way to share that document, apologies. Let me know if there's any other questions.

    Best,

    -Cole

  • Thank you Cole, I think that we will work together with other tickets, as soon as I receive other comments from our customer (ESA).

    I hope the updated SBAA222 will help.

    Your support is really appreciated!

    Good day,

    Emiliano