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DAC3174: Unable to pass IO test pattern

Part Number: DAC3174
Description:
1. When we are trying to check for the IO test pattern it is failing for the pattern given in the datasheet
2. So we are writing 0s in all the IO test pattern reg yet it is failing in 1st attempt whereas when we do the same process twice it passes with all 0s 
3. Process we are following is as follows
  • Writing 0s in my reg which should match with DAC regs having IO test pattern
  • Enabling sel line in my IO test pattern code
  • Resetting DAC
  • Writing 0s in all DAC IO test pattern regs
  • Clearing 4th reg of DAC which is for test pattern result indication
  • Configuring 0xE00E in 0x1 reg of DAC
  • Configuring 0x447C in 0x0 reg of DAC
  • Enabling TXENABLE line
  • Asserting sync pin in my IO test pattern code
  • Reading 0x4 and 0x5 reg of DAC

4. Simulation screenshot is attached