dear All,
it is not clear what disruptions are analyzed in the SET section of SBAA222 (SEFI, SET, register SEU’s), and what is not considered even if relevant, for which we don’t have data.
Table 5 is relevant to?
Table 7 is relevant to?
SEFI cross section data are not available because of what behaviour of the test setup? when does the device reset under irradiation?
please clarify what are the multiple error sources detected and characterized during the SET testing.
can you please link the data contained into the Table 6 with the relevant disruption (SEFI, SET, register SEU’s)?
we need to better understand what was tested and if we need to repeat some SET testing, based on your answer.
many thanks,
Emiliano