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ADS1282-SP: SET section in Radiation Report SBAA222–October 2017

Part Number: ADS1282-SP

dear All,

it is not clear what disruptions are analyzed in the SET section of SBAA222 (SEFI, SET, register SEU’s), and what is not considered even if relevant, for which we don’t have data.

Table 5 is relevant to?

Table 7 is relevant to?

SEFI cross section data are not available because of what behaviour of the test setup? when does the device reset under irradiation?

please clarify what are the multiple error sources detected and characterized during the SET testing.

can you please link the data contained into the Table 6 with the relevant disruption (SEFI, SET, register SEU’s)?

we need to better understand what was tested and if we need to repeat some SET testing, based on your answer.

many thanks,

Emiliano

  • Hi Emiliano,

    There a couple of these questions I don't think I understand, perhaps you can speak more generally? I'm also not an expert in this these tests my clarifying questions might be a lack of broader understanding on my part. So, I'm going to answer plainly and see if I can help clarify the questions a bit more:

    Table 5 is relevant to?

    Table 7 is relevant to?

    These are both in the Single Event Transient (SET) section and Table 5 describes the shape in Figure 14: Cross-Section for Register Upsets where table 7 describes the shape in Figure 15: SET Cross Section. If you need the equation, I think I can ask the team.

    SEFI cross section data are not available because of what behaviour of the test setup? when does the device reset under irradiation?

    Not sure if this is relevant but whenever I see "Configuration Registers Reset" in table 6, I assume they are talking about the text below in the SET section for SEFI (or else the Error columns should have been filled out): 

    please clarify what are the multiple error sources detected and characterized during the SET testing.

    Can you be more specific? It seems that they define the difference of Error and Error Event in the first couple of sentences in the Error section. Unless you want to know what the actual value of the reference was.

    Unless you're asking what causes the error in the device or sample which is generally covered in the intro:

    Again, apologizes if my understanding is a bit basic. I need to make sure I understand what the actual questions are before talking with the team.

    Thanks,

    -Cole

  • hello Cole,

    in brief, we need to understand what are the kinds of non-destructive SEEs included in the Analysis, e.g. SEFI seems not included.

    And we need to undestand what kinds of non-destructive SEEs are linked to the cross-sections values reported in Table 5 and in Table 7.

    If SEFI were observed together with other SEEs, and a discrimination is not possible, are they included in a cross-section value (Table 5/7) together with other SEEs?

    An explanation about Table 6 could help in order to clarify how the testing was conducted.

    The complete report [6] would be a great input in order to clarify the details of the SEE testing, we can say that SBAA222 is just a summary.

    I hope that my request is now more clear.

    BR,

    Emiliano

  • Hi Emiliano,

    Understood, let me talk with the team and see what they say.

    Best,

    -Cole

  • Hi Emiliano,

    Here's the response I got back:

    • In table 5 both the SET ( code deviations ) and SEU’s ( Register upsets and SEFI’s are all combined in SEU’S) are included in Table 5
    • In Table 7 the SEU’s are excluded and only the code deviations are used in Weibull calculations.

    Let me know if this fully doesn't answer the question.

    Best,

    -Cole