ADS1282-SP: Post Radiation and Aging

Florinda Fragassi

Prodigy 15 points

Part Number: ADS1282-SP

Hi team,

I am doing a worst-case analysis for the acquisition channel of my board.

I should repeat them in 3 conditions:

BOL Begin Of Life

BOL+Thermal drift

EOL End of Life

My using the ADS1282-SP (5962L1423101VXC), in the datasheet I do not find information about post radiation drift and aging on these parameters, important for EOL condition,

-INL

-OFFFSET

-GAIN ERROR

-Differential input impedance

-Common-mode input impedance

Where could I find these information?

Thanks

7 months ago

0 Keith Nicholas 7 months ago

TI__Mastermind 40860 points

Hello Florinda,

I do not believe that we took any data on the devices post-radiation exposure. Please give me 2 business days to do some research to see if we have any additional data.

Regards,
Keith Nicholas
Precision ADC Applications

0 Keith Nicholas 7 months ago in reply to Keith Nicholas

TI__Mastermind 40860 points

Hello Florinda,

We do have data for TID at 50kRAD (Si). This data can be found in section 7.5, Electrical Characteristics, section of the datasheet. All maximum value limits are post 50 kRads (Si) test at 25C.

We do not have any post-radiation data for any SEE tests.

Regards,
Keith

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ADS1282-SP: Post Radiation and Aging