Other Parts Discussed in Thread: AFE4300
Tool/software:
Good day,
I hope you are doing well.
I have a few questions regarding the AFE4300, which I am using solely for BCM measurement. I am currently designing a PCB for BCM measurement in EIT and have noticed discrepancies between the AFE4300 datasheet and the EVM devkit design files. Could you assist in clarifying these differences?
Additionally, I need help understanding the calibration resistors for BCM.
I came across an Opensource academic article that discusses using the AFE4300 for EIT. The author utilizes all VSENSE and IOUT channels for BCM, but also uses certain calibration-related pins/registers during the EIT measurement cycle. I was under the impression that the calibration registers are exclusively for calibration, not general BCM applications. Could you clarify this? Specifically, I am referring to the ISW_MUX register (bits [9:8] and [1:0]) and VSENSE_MUX (bits [9:8] and [1:0]).
Furthermore, what is the difference between outputting BCM measurements using OUTP_FILT/OUTM_FILT versus OUTP_Q_FILT/OUTM_Q_FILT? These options are controlled by PERIPHERAL_SEL[4:0] in ADC_CONTROL_REGISTER2. I assume the choice depends on the BCM measurement method—could you confirm?
Lastly, why does the AFE4300 kit include additional amplifier circuitry for VSENSE?
I also have questions about the AFE4300 kit IOUT pins circuitry
I appreciate your time and assistance.
Best regards
Aidan
