This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

How does "Aperture delay" relate to "sample and hold window" on the ADS5560?

Other Parts Discussed in Thread: ADS5560

On the ADS5560 data sheet, the block diagram shows a sample and hold block, which is implemented with FETs and Capacitors as shown on figure 45.  The sampling switch must go to Ron=10 ohms for a while to sample the differential voltage on to the capacitors, then shut off to hold the charge.  The RC time constant for half of the differential sample circuit is ~20 ohm * 6 pF = 120 ps, so the sampling switch must be on for at least 4*RC = 500 ps.  The aperture spec tA in section 6.11 is 0.5-2 ns, from the rising clock edge.  Does this mean that the sampling window opens up 0.5-2 ns after the clock edge, and then closes some time later, or that the sampling window closes 0.5-2 ns from the rising clock edge, and opens sometime earlier?  Or maybe it opens and closes, centered around 0.5-2 ns after the rising clock edge?  How do we know how long the sampling switches are turned on?

I need to put an analog multiplexer in front of the ADC differential inputs to switch input sources, and I need to know how soon after the rising clock edge I can safely switch the input source, and how quickly the ADC inputs need to be ready for the next measurement.  (The hold and setup times for the analog inputs, with respect to the rising edge of the clock.)  The clock period of the ADS5560 is 25 ns.  

  • Hi,

    As you've described, the track and hold circuit is such that during the clock low time the sampling cap is connected to the incoming signal so that the voltage on the sampling cap will 'track' the analog input while the clock is low and the FET switches connect the sampling caps to the incoming signal.   Then when the sample clock goes high the FET switch opens and isolates the sample cap from the outside world and 'holds' the input voltage for a half clock cycle for the ADC to resolve the held voltage into a digital code.

    Since it takes some time for the sample clock to be received into the ADC through the clock input buffer and for the FET switches to open, there will be some delay from the clock edge at the pins of the device to the instant where the analog input is actually frozen on the sample cap.  This delay is the specified aperture delay that you are asking about.  The aperture delay will not always be a constant across temperature and voltage but will vary, and it may vary from a minimum of 0.5ns on one device at one extreme of voltage and temperature to a maximum of 2ns on another device at the other extreme of voltage and temperature.  

    So you would want to not switch your source any sooner than 2ns after the clock edge because you know that the sampling instant will have occurred by that time.

    Regards,

    Richard P.