Other Parts Discussed in Thread: , DXP
Hi
We are using three AFE5801 ICs in our board , All three IC are being fed a single ended clock of 40MHz from FPGA CLOCK pin through buffers.
We are enabling test patterns with SPI writes , and acquiring LVDS outputs with FPGA and displaying them in chip scope tool. We see that the data patterns read are corrupt and not as expected.
But if we reduce clock frquency to 16MHz , the patterns read from LVDS with FPGA chip scope tool looks fine. Data as expected.
Any clue on why at high frequency data is corrupted ?? But we see that clock measured at both 16MHz and 40MHz on a scope looks very similar and less distorted.