VSP5610: VSP5610

purvi gupta

Part Number: VSP5610

Hello TI,

We do have following queries related to AFE VSP5610:

Is the below method correct to measure noise floor?

- Configured AFE in CDS mode + Pixel Clamp

- Decoupled analog signal input (AINx) and analog signal ground (AINGNDx) with 0.1uF to Circuit Ground (AGND)

- Measured the Digital Counts of AFE.

Regards,

Purvi

0 Praveen Aroul over 6 years ago

Hello Purvi,

Your method to measure noise is correct.

By AC coupling both AINx and AINGNDx to AGND through the 0.1uF cap, you will measure the idle channel noise.

CDS mode reduces both the reset noise and other low-frequency noise.

0 purvi gupta over 6 years ago in reply to Praveen Aroul

Hello Praveen,

Thanks for your Quick Response.

We do have following queries:

When AINx pin of AFE is connected to AGND through a Capacitor - Ideally a constant DC level should appear on this Pin. Right?
Does the noise floor test depends on SHP/SHP Timing Values? If yes then how do we decide the SHP/SHD Timing Values? When CCD signal is injected to AFE,we know that SHP and SHD timing should be configured in such a way that SHP pulse falls during "Reference level" and SHD pulse falls during "Data level" of CCD signal. But when the signal is connected to AGND - How do we configure SHP/SHD timing?

Regards,

Purvi

0 purvi gupta over 6 years ago in reply to purvi gupta

Hello Praveen,

Did you get the chance to look into this?

Regards,

Purvi

0 Praveen Aroul over 6 years ago in reply to purvi gupta

Hi Purvi,

I have responded to your questions in the email and haven't heard back from you.

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