• State TI Thinks Resolved
  • Locked Locked
  • Replies 1 reply
  • Answers 1 answer
  • Subscribers 46 subscribers
  • Views 142 views
  • Users 0 members are here
Support feedback
Options
Options
Similar topics

This thread has been locked.

If you have a related question, please click the "Ask a related question" button in the top right corner. The newly created question will be automatically linked to this question.

Original question:

LMP92066: Data retention period on the LMP92066 EEPROM

LMP92066: Potential failure mechanism if 125°C is exceeded - Hard failure, thermal shutdown or graceful degradation?

Christopher Monroy
Prodigy 100 points
Part Number: LMP92066

Hello, I would like to ask about the potential failure mechanism in the LMP92066 during 125°C operation or also in the event the temperature of 125°C is exceeded (estimate of 135°C)

Would this device have graceful degradation, like a shift in the analog voltage at the DAC output or could it have a hard failure like a thermal shutdown if for example the device exceeds the 125°C.

My prior question on this device was about data retention over ten years, and the answer was that the device was baked at high temperatures. Was that high temperature bake applied during operation?

  • 0
    TI__Guru 52663 points

    Hi Christopher,

    It is difficult to say for certain what the failure mechanism would be.  During device development, we do accelerated life testing to try to ensure that the device will remain functional over an expected life time, depending on the qualification requirements (catalog, automotive, EP, etc.).  This device was subjected to high-temp-over-life (HTOL) testing.  For example, we might bake the device at 150°C for 1000hrs, which would then give us an acceleration factor for our life time modeling.  That acceleration factor can be used to estimate equivalent life using the Arrhenius model.

    .

    Using this model you can estimate safe working life for various temperatures.  The closer to the stress temperature you operate, the shorter the life.  If you are operating at 125° or 135°C, your factor is pretty low.  And if you are operating at 150°C, then your AF is 1, and we only show 1000hours life.

    We verify functionality after accelerating life testing using the same test limits as a new device.  So while there could be some degradation or shift, it would still be a failure if the shift was beyond our specified limits.

    Beyond that, the failure mechanism is not known.  My recommendation is that you create your mission profile, and use the Arrhenius equation to estimate the devices projected life length at that profile.  

    Thanks,
    Paul