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ADS1120-Q1: Temperature sensor variation under immunity test

Part Number: ADS1120-Q1

Dear team,

My customer is evaluating the ADS1120-Q1 in their system. In the immunity test, they found that the internal temperature sensor value of the ADS1120-Q1 varied, around 1°C to 2°C variation, with exposures over 400MHz. At present, the direction of change has only been confirmed on the upward side, but it is not certain.

They assume that the internal temperature sensor of ADS1120-Q1 is a semiconductor (diode?) , is it possible to take measures in their circuit if it is affected by high-frequency irradiation?

Also, if there are known events such as the mechanism of temperature variation, please let me know.
Thank you.

Best Regards,

Koshi Ninomiya

  • Hi Ninomiya-san,

    Most likely the RFI is entering in through either the supply and/or analog inputs.  What we have seen in the past is the RFI becomes rectified through internal devices within the ADC and produces an offset.

    If the RFI is getting in through the analog inputs, additional filtering may be required at the input.  Sometimes adding a ferrite can produce a significant improvement.

    Best regards,

    Bob B